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公开(公告)号:US09892353B1
公开(公告)日:2018-02-13
申请号:US15281637
申请日:2016-09-30
Applicant: Amazon Technologies, Inc.
Inventor: Tak Keung Joseph Lui , Jeremy Dashe , Oleg Kantor , Maju Cheruvallil Kuruvilla , Alton Paul Werronen , Nelson Ramon
IPC: G06K17/00 , H04W4/00 , H04B17/318 , H04W4/02
CPC classification number: G06K17/0022 , H04B17/318 , H04W4/02 , H04W4/80
Abstract: Features are disclosed for collecting wireless identifier signals such as from RFID tags to accurately determine the location of items associated with the wireless identifier. Carefully coordinating when to begin and end collection of the signals and analysis of the signals and signal characteristics (e.g., received signal strength) allow a carried item to be identified and its location determined. Additional features are described to further validate the location of the item.
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公开(公告)号:US20170364720A1
公开(公告)日:2017-12-21
申请号:US15634659
申请日:2017-06-27
Applicant: Amazon Technologies, Inc.
Inventor: Oleg Kantor , Tak Keung Joseph Lui
CPC classification number: G06K7/10366 , G01S1/02 , G01S5/02 , G01S13/75 , G01S13/878 , G06K7/10356
Abstract: Techniques for determining an item location based on multiple RFID parameters from multiple read events are described. In an example, a computer system may access a first read event. A first RFID reader located within a first zone may have generated the first read event at a first time. The first read event may identify an RFID tag and may include first RFID parameters. The computer system may access a second read event. A second RFID reader located within a second zone may have generated the second read event at a second time within a predefined amount of time from the first time. The second read event may identify the RFID tag and include second RFID parameters. The computer system may determine whether the item location falls within the first zone or the second zone based on two or more first RFID parameters and two or more second RFID parameters.
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公开(公告)号:US09734368B1
公开(公告)日:2017-08-15
申请号:US15185933
申请日:2016-06-17
Applicant: Amazon Technologies, Inc.
Inventor: Oleg Kantor , Tak Keung Joseph Lui
CPC classification number: G06K7/10366 , G01S1/02 , G01S5/02 , G01S13/75 , G01S13/878 , G06K7/10356
Abstract: Techniques for determining an item location based on multiple RFID parameters from multiple read events are described. In an example, a computer system may access a first read event. A first RFID reader located within a first zone may have generated the first read event at a first time. The first read event may identify an RFID tag and may include first RFID parameters. The computer system may access a second read event. A second RFID reader located within a second zone may have generated the second read event at a second time within a predefined amount of time from the first time. The second read event may identify the RFID tag and include second RFID parameters. The computer system may determine whether the item location falls within the first zone or the second zone based on two or more first RFID parameters and two or more second RFID parameters.
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