Abstract:
A fuse detecting apparatus includes a detector, a calibrator and a logical operating unit. The detector includes a detecting switch module and a detecting latch. The detecting switch module generates an initial detecting result according to first and second control signals and a status of the fuse. The detecting latch stores a voltage level of the initial detecting result or maintains its originally stored voltage level according to the initial detecting result for generating a pre-calibrating detecting signal. The calibrator includes a calibrating switch module and a calibrating latch. The calibrating switch module generates a calibrating result according to the first and second control signals. The calibrating latch stores the calibrating result and generates a calibrating signal accordingly. The logical operating unit generates a calibrated detecting signal according to the pre-calibrating detecting signal and the calibrating signal.
Abstract:
A fuse detecting apparatus including a detector, a calibrator and a logical operating unit is disclosed. The detector includes a detecting switch module and a detecting latch. The detecting switch module generates an initial detecting result according to a first and a second control signals and a status of the fuse. The detecting latch stores a voltage level of the initial detecting result or maintains its originally stored voltage level according to the initial detecting result for generating a pre-calibrating detecting signal. The calibrator includes a calibrating switch module and a calibrating latch. The calibrating switch module generates a calibrating result according to the first and the second control signals. The calibrating latch stores the calibrating result and generates a calibrating signal accordingly. The logical operating unit generates a calibrated detecting signal according to the pre-calibrating detecting signal and the calibrating signal.
Abstract:
An apparatus inspects internal defects of substrate, the substrate having an upper surface and a plurality of side surfaces connected with the upper surface. The apparatus includes at least one light source arranged on one of the side surfaces of the substrate and emitting a light beam on the corresponding side surface and into the substrate, the incident angle of the light beam is limited to a first predetermined angle within a range allowing the light beam to transmit in a total internal reflection manner in the substrate; an image capturing module arranged above the substrate to capture the image of the upper surface of the substrate, a light shield mask arranged between the image capturing module and the substrate and shielding an edge portion of the upper surface of the substrate.
Abstract:
The present invention relates to a location-adjusting inspecting apparatus and method for a solar battery panel inspecting system. The inspecting apparatus includes an image-fetching device and a set of rotatable probe devices. A transport platen of the inspecting system transports a solar battery panel to an inspecting region. The image-fetching device fetches an image of electrode lines on the battery panel, and calculates an offset data by comparing the fetched image with a correct data representing the position and angle of electrode lines. Finally, the probe devices are controlled to generate a corrective rotation based on the calculated offset data. In this way, when pressing the solar battery panel, the probes of the probe devices can be aligned with and contact the electrode lines of the solar battery panel correctly, thereby increasing the accuracy in the inspection of the solar battery panel.
Abstract:
An audio codec and a BIST method adapted for the audio codec are provided. The BIST method includes the following steps. A first channel digital-to-analog converter (DAC) of the audio codec converts a test signal into an analog signal. A first channel analog-to-digital converter (ADC) of the audio codec converts the analog signal into a digital signal. Use a second channel DAC of the audio codec and a second channel ADC of the audio codec to calculate the magnitudes of a plurality of spectral components of the DFT of the digital signal. Determine whether the audio codec passes the test according to the magnitudes of the spectral components.