MEMORY DEVICE AND METHOD FOR FABRICATING THE SAME
    11.
    发明申请
    MEMORY DEVICE AND METHOD FOR FABRICATING THE SAME 有权
    存储器件及其制造方法

    公开(公告)号:US20130134497A1

    公开(公告)日:2013-05-30

    申请号:US13304378

    申请日:2011-11-24

    IPC分类号: H01L29/788 H01L21/336

    摘要: A memory device is described, including a gate over a substrate, a gate dielectric between the gate and the substrate, and two charge storage layers. The width of the gate is greater than that of the gate dielectric, so that two gaps are present at both sides of the gate dielectric and between the gate and the substrate. Each charge storage layer includes a body portion in one of the gaps, a first extension portion connected with the body portion and protruding out of the corresponding sidewall of the gate, and a second extension portion connected to the first extension portion and extending along the sidewall of the gate, wherein the edge of the first extension portion protrudes from the sidewall of the second extension portion.

    摘要翻译: 描述了存储器件,包括衬底上的栅极,栅极和衬底之间的栅极电介质,以及两个电荷存储层。 栅极的宽度大于栅极电介质的宽度,使得在栅极电介质的两侧以及栅极和衬底之间存在两个间隙。 每个电荷存储层包括在一个间隙中的主体部分,与主体部分连接并从门的相应侧壁突出的第一延伸部分,以及连接到第一延伸部分并沿着侧壁延伸的第二延伸部分 所述第一延伸部分的边缘从所述第二延伸部分的侧壁突出。