DETERMINING WIDTH AND HEIGHT OF ELECTRON SPOT

    公开(公告)号:US20210249215A1

    公开(公告)日:2021-08-12

    申请号:US16973497

    申请日:2019-06-24

    Applicant: Excillum AB

    Abstract: A method in an X-ray source configured to emit, from an interaction region, X-ray radiation generated by an interaction between an electron beam and a target, the method including the steps of: providing the target; providing the electron beam; deflecting the electron beam along a first direction relative the target; detecting electrons indicative of the interaction between the electron beam and the target; determining a first extension of the electron beam on the target, along the first direction, based on the detected electrons and the deflection of the electron beam; detecting X-ray radiation generated by the interaction between the electron beam and the target; and determining a second extension of the electron beam on the target, along a second direction, based on the detected X-ray radiation.

    VAPOUR MONITORING
    12.
    发明申请
    VAPOUR MONITORING 审中-公开

    公开(公告)号:US20200058461A1

    公开(公告)日:2020-02-20

    申请号:US16499582

    申请日:2018-03-27

    Applicant: Excillum AB

    Abstract: A method for generating X-ray radiation, the method including providing a liquid target in a chamber, directing an electron beam towards the liquid target such that the electron beam interacts with the liquid target to generated X-ray radiation, estimating a number of particles produced from the interaction between the electron beam and the liquid target by measuring a number of positively charged particles in the chamber and eliminating a contribution from scattered electrons to the estimated number of particles, and controlling the electron beam, and/or a temperature in a region of the liquid target in which the electron beam interacts with the target, such that the estimated number of particles is below a predetermined limit. Also, a corresponding X-ray source.

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