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11.
公开(公告)号:US11579347B2
公开(公告)日:2023-02-14
申请号:US16575411
申请日:2019-09-19
Applicant: FUJIFILM CORPORATION
Inventor: Masashi Ono , Hideki Yasuda
Abstract: Provided are semiconductor particles including a Group 12-16 semiconductor including a Group 12 element and a Group 16 element, a Group 13-15 semiconductor including a Group 13 element and a Group 15 element, or a Group 14 semiconductor including a Group 14 element, the semiconductor particles having a plasma frequency of 1.7×1014 rad/s to 4.7×1014 rad/s and a maximum length of 1 nm to 2,000 nm; and a dispersion, a film, an optical filter, a building member, or a radiant cooling device, in all of which the semiconductor particles are used.
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公开(公告)号:US11360249B2
公开(公告)日:2022-06-14
申请号:US17337436
申请日:2021-06-03
Applicant: FUJIFILM CORPORATION
Inventor: Hideki Yasuda
Abstract: Provided is a multilayer structure including a radiator, a base material layer that includes a region forming an interface in an internal structure, and a first air layer that is provided between the radiator and the base material layer, in which a far-infrared transmittance B of the base material layer and a solar light reflectance A of the multilayer structure satisfy B/(100−A)>7, and a solar light reflectance C of the base material layer is 30% or more.
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公开(公告)号:US11112314B2
公开(公告)日:2021-09-07
申请号:US16819220
申请日:2020-03-16
Applicant: FUJIFILM CORPORATION
Inventor: Hideki Yasuda
Abstract: Provided is an infrared absorptive material having a high refractive index layer that has a refractive index of 3.0 or higher for infrared light at any wavelength in the wavelength range of 2 μm to 50 μm and has a thickness of 8 nm to 15,000 nm; and a reflective layer positioned on one face of the high refractive index layer.
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公开(公告)号:US10310143B2
公开(公告)日:2019-06-04
申请号:US15168532
申请日:2016-05-31
Applicant: FUJIFILM Corporation
Inventor: Hideki Yasuda , Ryou Matsuno , Takeharu Tani
Abstract: An anti-reflection optical member has a laminated structure including: a transparent substrate having a first refractive index greater than that of a predetermined medium; a metal-microparticle-containing layer containing metal microparticles; and a dielectric layer having a second refractive index greater than that of the predetermined medium, in this order. At least 60% of the metal microparticles are flat particles with a diameter-to-thickness ratio of 3 or more. Principal planes of the flat metal particles are surface-oriented in the range from 0° to 30° relative to the surface of the metal-microparticle-containing layer. In the metal-microparticle-containing layer, the metal microparticles are disposed without forming a conductive path. The dielectric layer has such a thickness that light reflected at the surface of the dielectric layer of incident light entering the laminated structure from the surface is interfered and canceled by light reflected at the interface between the dielectric layer and the metal-microparticle-containing layer.
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