Method for pre-conditioning CMP polishing pad
    12.
    发明授权
    Method for pre-conditioning CMP polishing pad 有权
    CMP抛光垫预处理方法

    公开(公告)号:US08021566B2

    公开(公告)日:2011-09-20

    申请号:US11497588

    申请日:2006-08-02

    IPC分类号: H01L21/302

    摘要: An apparatus and method suitable for the pre-conditioning of a polishing pad on a CMP apparatus prior to the polishing of production wafers on the apparatus. The apparatus includes a pre-conditioning arm on which is mounted an ingot of suitable material. In use, the ingot is pressed against the polishing surface of the rotating polishing pad for a selected period of time to increase the temperature of the polishing surface by friction. The pre-conditioned polishing pad facilitates uniform polishing rates of production semiconductor wafers subsequently polished on the apparatus.

    摘要翻译: 一种适于在抛光装置上的生产晶片之前对CMP装置上的抛光垫进行预处理的装置和方法。 该装置包括预调节臂,在其上安装合适材料的锭。 在使用中,将铸锭压在旋转的抛光垫的抛光表面上一段选定的时间,以通过摩擦来增加抛光表面的温度。 预处理的抛光垫有助于随后在设备上抛光的生产半导体晶片的均匀抛光速率。

    Apparatus for pre-conditioning CMP polishing pad
    13.
    发明授权
    Apparatus for pre-conditioning CMP polishing pad 有权
    CMP抛光垫预处理设备

    公开(公告)号:US07105446B2

    公开(公告)日:2006-09-12

    申请号:US10656585

    申请日:2003-09-04

    IPC分类号: B24B7/00

    摘要: An apparatus and method suitable for the pre-conditioning of a polishing pad on a CMP apparatus prior to the polishing of production wafers on the apparatus. The apparatus includes a pre-conditioning arm on which is mounted an ingot of suitable material. In use, the ingot is pressed against the polishing surface of the rotating polishing pad for a selected period of time to increase the temperature of the polishing surface by friction. The pre-conditioned polishing pad facilitates uniform polishing rates of production semiconductor wafers subsequently polished on the apparatus.

    摘要翻译: 一种适于在抛光装置上的生产晶片之前对CMP装置上的抛光垫进行预处理的装置和方法。 该装置包括预调节臂,在其上安装合适材料的锭。 在使用中,将铸锭压在旋转的抛光垫的抛光表面上一段选定的时间,以通过摩擦来增加抛光表面的温度。 预处理的抛光垫有助于随后在设备上抛光的生产半导体晶片的均匀抛光速率。

    Apparatus and method for pre-conditioning CMP polishing pad
    14.
    发明申请
    Apparatus and method for pre-conditioning CMP polishing pad 有权
    CMP抛光垫预处理的设备和方法

    公开(公告)号:US20050051266A1

    公开(公告)日:2005-03-10

    申请号:US10656585

    申请日:2003-09-04

    摘要: An apparatus and method suitable for the pre-conditioning of a polishing pad on a CMP apparatus prior to the polishing of production wafers on the apparatus. The apparatus includes a pre-conditioning arm on which is mounted an ingot of suitable material. In use, the ingot is pressed against the polishing surface of the rotating polishing pad for a selected period of time to increase the temperature of the polishing surface by friction. The pre-conditioned polishing pad facilitates uniform polishing rates of production semiconductor wafers subsequently polished on the apparatus.

    摘要翻译: 一种适于在抛光装置上的生产晶片之前对CMP装置上的抛光垫进行预处理的装置和方法。 该装置包括预调节臂,在其上安装合适材料的锭。 在使用中,将铸锭压在旋转的抛光垫的抛光表面上一段选定的时间,以通过摩擦来增加抛光表面的温度。 预处理的抛光垫有助于随后在设备上抛光的生产半导体晶片的均匀抛光速率。