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公开(公告)号:US08348719B2
公开(公告)日:2013-01-08
申请号:US11727119
申请日:2007-03-23
申请人: Hsin-Hsien Lu , Liang-Guang Chen , Tien-I Bao , Shau-Lin Shue
发明人: Hsin-Hsien Lu , Liang-Guang Chen , Tien-I Bao , Shau-Lin Shue
CPC分类号: B24B37/22 , B24B37/042 , B24B37/24
摘要: Embodiments of a polisher for chemical mechanical planarization. The polisher includes a polishing pad structure containing a first reactant therein, and a second reactant in a polishing environment over the polishing pad structure. The first reactant and the second reactant react endothermically upon contact when polishing a wafer surface between the polishing pad structure and the polishing environment.
摘要翻译: 用于化学机械平面化的抛光机的实施例。 抛光机包括在其中包含第一反应物的抛光垫结构和在抛光环境中的抛光垫结构上的第二反应物。 当抛光抛光垫结构和抛光环境之间的晶片表面时,第一反应物和第二反应物在接触时发生吸热反应。
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公开(公告)号:US08021566B2
公开(公告)日:2011-09-20
申请号:US11497588
申请日:2006-08-02
IPC分类号: H01L21/302
CPC分类号: B24B53/017 , B24B37/042 , B24B49/16
摘要: An apparatus and method suitable for the pre-conditioning of a polishing pad on a CMP apparatus prior to the polishing of production wafers on the apparatus. The apparatus includes a pre-conditioning arm on which is mounted an ingot of suitable material. In use, the ingot is pressed against the polishing surface of the rotating polishing pad for a selected period of time to increase the temperature of the polishing surface by friction. The pre-conditioned polishing pad facilitates uniform polishing rates of production semiconductor wafers subsequently polished on the apparatus.
摘要翻译: 一种适于在抛光装置上的生产晶片之前对CMP装置上的抛光垫进行预处理的装置和方法。 该装置包括预调节臂,在其上安装合适材料的锭。 在使用中,将铸锭压在旋转的抛光垫的抛光表面上一段选定的时间,以通过摩擦来增加抛光表面的温度。 预处理的抛光垫有助于随后在设备上抛光的生产半导体晶片的均匀抛光速率。
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公开(公告)号:US07105446B2
公开(公告)日:2006-09-12
申请号:US10656585
申请日:2003-09-04
IPC分类号: B24B7/00
CPC分类号: B24B53/017 , B24B37/042 , B24B49/16
摘要: An apparatus and method suitable for the pre-conditioning of a polishing pad on a CMP apparatus prior to the polishing of production wafers on the apparatus. The apparatus includes a pre-conditioning arm on which is mounted an ingot of suitable material. In use, the ingot is pressed against the polishing surface of the rotating polishing pad for a selected period of time to increase the temperature of the polishing surface by friction. The pre-conditioned polishing pad facilitates uniform polishing rates of production semiconductor wafers subsequently polished on the apparatus.
摘要翻译: 一种适于在抛光装置上的生产晶片之前对CMP装置上的抛光垫进行预处理的装置和方法。 该装置包括预调节臂,在其上安装合适材料的锭。 在使用中,将铸锭压在旋转的抛光垫的抛光表面上一段选定的时间,以通过摩擦来增加抛光表面的温度。 预处理的抛光垫有助于随后在设备上抛光的生产半导体晶片的均匀抛光速率。
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公开(公告)号:US20050051266A1
公开(公告)日:2005-03-10
申请号:US10656585
申请日:2003-09-04
CPC分类号: B24B53/017 , B24B37/042 , B24B49/16
摘要: An apparatus and method suitable for the pre-conditioning of a polishing pad on a CMP apparatus prior to the polishing of production wafers on the apparatus. The apparatus includes a pre-conditioning arm on which is mounted an ingot of suitable material. In use, the ingot is pressed against the polishing surface of the rotating polishing pad for a selected period of time to increase the temperature of the polishing surface by friction. The pre-conditioned polishing pad facilitates uniform polishing rates of production semiconductor wafers subsequently polished on the apparatus.
摘要翻译: 一种适于在抛光装置上的生产晶片之前对CMP装置上的抛光垫进行预处理的装置和方法。 该装置包括预调节臂,在其上安装合适材料的锭。 在使用中,将铸锭压在旋转的抛光垫的抛光表面上一段选定的时间,以通过摩擦来增加抛光表面的温度。 预处理的抛光垫有助于随后在设备上抛光的生产半导体晶片的均匀抛光速率。
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