公开(公告)号：US20180114585A1

公开(公告)日：2018-04-26

申请号：US15298360

申请日：2016-10-20

申请人： International Business Machines Corporation

发明人： Harry Barowski ,  Sheldon Levenstein ,  Pradip Patel ,  Daniel Rodko ,  Gordon B. Sapp ,  Rolf Sautter

IPC分类号： G11C29/40 ,  G11C29/44

CPC分类号： G11C29/40 ,  G11C15/00 ,  G11C29/024 ,  G11C29/14 ,  G11C29/44 ,  G11C2029/3602

摘要： The present invention provides a system and method of testing CAMs and RAMs. In an exemplary embodiment, the system includes a multiple input signature register (MISR) logically coupled to digital outputs of a CAM, to digital inputs of a RAM, and to digital outputs of an ABIST controller circuit, where the MISR includes a plurality of L1 latch circuits logically coupled to a plurality of L2 latch circuits, a plurality of multiplexer circuits logically coupled to the plurality of L1 latch circuits, a plurality of exclusive or circuits (inner XOR circuits) logically coupled to the plurality of MUX circuits and to the plurality of L2 latch circuits, and at least two XOR circuits (outer XOR circuits), each of the outer XOR circuits logically coupled to one of the inner XOR circuits, to at least one of the MUX circuits, and to at least one of the L2 latch circuits.