SELECTIVELY SUPPORTING STATIC BRANCH PREDICTION SETTINGS ONLY IN ASSOCIATION WITH PROCESSOR-DESIGNATED TYPES OF INSTRUCTIONS

    公开(公告)号:US20200167163A1

    公开(公告)日:2020-05-28

    申请号:US16200191

    申请日:2018-11-26

    IPC分类号: G06F9/38

    摘要: A processor reads at least one instruction comprising at least one of a branch instruction and a non-branch instruction. In response to the branch instruction comprising a conditional branch instruction and set in dynamic mode, the processor dynamically predicts a branch path as taken or not taken. The processor, in response to the instruction fetch unit set in static mode for a conditional branch instruction and static branch prediction setting bits received with the conditional branch instruction specifying static branch prediction, statically sets the branch path as taken or not taken according to the static branch prediction setting bits received with the branch instruction. The processor selectively sets the operation of the processor temporarily from the dynamic mode to the static mode only in response to detecting a type of the at least one instruction matches a type of instruction qualifying to trigger static branch prediction.

    Testing content addressable memory and random access memory

    公开(公告)号:US10170199B2

    公开(公告)日:2019-01-01

    申请号:US15898893

    申请日:2018-02-19

    摘要: The present invention provides a system and method of testing CAMs and RAMs. In an exemplary embodiment, the system includes a multiple input signature register (MISR) logically coupled to digital outputs of a CAM, to digital inputs of a RAM, and to digital outputs of an ABIST controller circuit, where the MISR includes a plurality of L1 latch circuits logically coupled to a plurality of L2 latch circuits, a plurality of multiplexer circuits logically coupled to the plurality of L1 latch circuits, a plurality of exclusive or circuits (inner XOR circuits) logically coupled to the plurality of MUX circuits and to the plurality of L2 latch circuits, and at least two XOR circuits (outer XOR circuits), each of the outer XOR circuits logically coupled to one of the inner XOR circuits, to at least one of the MUX circuits, and to at least one of the L2 latch circuits.

    Selectively supporting static branch prediction settings only in association with processor-designated types of instructions

    公开(公告)号:US11163577B2

    公开(公告)日:2021-11-02

    申请号:US16200191

    申请日:2018-11-26

    IPC分类号: G06F9/30 G06F9/38

    摘要: A processor reads at least one instruction comprising at least one of a branch instruction and a non-branch instruction. In response to the branch instruction comprising a conditional branch instruction and set in dynamic mode, the processor dynamically predicts a branch path as taken or not taken. The processor, in response to the instruction fetch unit set in static mode for a conditional branch instruction and static branch prediction setting bits received with the conditional branch instruction specifying static branch prediction, statically sets the branch path as taken or not taken according to the static branch prediction setting bits received with the branch instruction. The processor selectively sets the operation of the processor temporarily from the dynamic mode to the static mode only in response to detecting a type of the at least one instruction matches a type of instruction qualifying to trigger static branch prediction.

    Testing content addressable memory and random access memory

    公开(公告)号:US10593420B2

    公开(公告)日:2020-03-17

    申请号:US15898861

    申请日:2018-02-19

    摘要: The present invention provides a system and method of testing CAMs and RAMs. In an exemplary embodiment, the system includes a multiple input signature register (MISR) logically coupled to digital outputs of a CAM, to digital inputs of a RAM, and to digital outputs of an ABIST controller circuit, where the MISR includes a plurality of L1 latch circuits logically coupled to a plurality of L2 latch circuits, a plurality of multiplexer circuits logically coupled to the plurality of L1 latch circuits, a plurality of exclusive or circuits (inner XOR circuits) logically coupled to the plurality of MUX circuits and to the plurality of L2 latch circuits, and at least two XOR circuits (outer XOR circuits), each of the outer XOR circuits logically coupled to one of the inner XOR circuits, to at least one of the MUX circuits, and to at least one of the L2 latch circuits.