Media contact zone with bell-shaped texturing features
    11.
    发明授权
    Media contact zone with bell-shaped texturing features 失效
    具有钟形纹理特征的介质接触区

    公开(公告)号:US06663938B1

    公开(公告)日:2003-12-16

    申请号:US09210018

    申请日:1998-12-11

    IPC分类号: G11B582

    摘要: A magnetic data recording medium substrate has a contact zone and a data zone. The contact zone is textured by forming multiple texturing features, each having a bell-shaped profile resembling a Gaussian curve. The features preferably are formed by pulsed laser energy applied to a glass substrate, or to an aluminum nickel-phosphorous substrate coated with a glass layer. As compared to previous laser texturing approaches, the laser beam is less narrowly focused to provide a beam impingement area with a diameter of at least three microns, forming texturing features with diameters of at least three microns. The texturing features preferably are uniform in height and diameter, and may be symmetrical or have asymmetrical aspects, so long as bell-shaped profiles are present in the direction of travel of the recording medium, relative to transducing heads.

    摘要翻译: 磁数据记录介质基板具有接触区和数据区。 通过形成多个纹理特征来形成接触区域,每个具有类似于高斯曲线的钟形轮廓。 特征优选通过施加到玻璃基板的脉冲激光能量或涂覆有玻璃层的铝镍磷基板形成。 与以前的激光纹理方法相比,激光束的聚焦较少,以提供直径至少为三微米的光束冲击区域,形成具有至少三微米直径的纹理特征。 纹理特征优选地在高度和直径上是均匀的,并且可以是对称的或具有不对称的方面,只要钟形轮廓相对于换能头在记录介质的行进方向上存在。

    Glide test head assembly with enhanced signal output
    12.
    发明授权
    Glide test head assembly with enhanced signal output 有权
    滑动测试头组件具有增强的信号输出

    公开(公告)号:US06363777B1

    公开(公告)日:2002-04-02

    申请号:US09497371

    申请日:2000-02-03

    IPC分类号: G01B528

    CPC分类号: G01B7/34

    摘要: A glide test head assembly glide test head assembly in which the mounting orientation of the piezo element has been modified. The glide test head assembly mounts the piezo element with one of its major surfaces coincident with the surface of the laterally-extending wing on which it is mounted. The mounting orientation of the piezo element allows the piezo element to be mounted fully on the laterally-extending wing of the glide test head assembly, raising the resonant frequency of the piezo element, decreasing the glide test head assembly's sensitivity to excitation caused by air flow disturbances, and increasing the reliability of glide test results.

    摘要翻译: 滑动试验头组件滑行试验头组件,其中压电元件的安装方向已被修改。 滑动测试头组件安装压电元件,其主表面中的一个主表面与其所安装的横向延伸翼的表面重合。 压电元件的安装方向允许压电元件完全安装在滑动测试头组件的横向延伸的翼上,提高压电元件的谐振频率,减少滑动测试头组件对由气流引起的激励的敏感性 扰动,提高滑翔测试结果的可靠性。

    System and method for uniform frequency response independent of slider
contact location in glide tests
    13.
    发明授权
    System and method for uniform frequency response independent of slider contact location in glide tests 失效
    独立于滑移测试中滑块接触位置的均匀频率响应的系统和方法

    公开(公告)号:US6000282A

    公开(公告)日:1999-12-14

    申请号:US158297

    申请日:1998-09-22

    摘要: A system for detecting and measuring the height of asperities on a substantially flat solid surface is disclosed. The system includes a glide head assembly for contacting asperities on the substantially flat solid surface and producing a sensor voltage whose frequency response is a function of both the height of the asperities and the location at which the glide head assembly contacts the asperities. The system also includes a signal processing device responsive to the sensor voltage from the glide head assembly for analytically defining a frequency window within which the frequency response of the sensor voltage is relatively independent of the location on the glide head assembly at which the glide head assembly contacts the asperities. The signal processing device measures the height of an encountered asperity by computing an actual RMS voltage within the frequency window of the frequency response of the sensor voltage produced by the glide head assembly after contacting the asperity.

    摘要翻译: 公开了一种用于检测和测量基本平坦的固体表面上的凹凸的高度的系统。 该系统包括滑动头组件,用于接触基本上平坦的固体表面上的凹凸,并产生传感器电压,其频率响应是凹凸的高度和滑动头组件接触凹凸的位置的函数。 该系统还包括响应于来自滑动头组件的传感器电压的信号处理装置,用于分析地限定频率窗口,在该频率窗口内,传感器电压的频率响应相对独立于滑动头组件上的位置,滑动头组件 联系不平凡。 信号处理装置通过计算在接触凹凸之后由滑动头组件产生的传感器电压的频率响应的频率窗内的实际RMS电压来测量遇到的粗糙度的高度。

    Method of calibrating a system for detecting contact of a glide head with a recording media surface
    14.
    发明授权
    Method of calibrating a system for detecting contact of a glide head with a recording media surface 失效
    校准用于检测滑动头与记录介质表面的接触的系统的方法

    公开(公告)号:US06293135B1

    公开(公告)日:2001-09-25

    申请号:US09664713

    申请日:2000-09-19

    IPC分类号: G01B1130

    摘要: A method and apparatus for calibrating a glide head and detector system performs a pre-screening to ensure the quality of the glide head and the piezoelectric sensor in the detection system. The glide head and the piezoelectric sensor detect a signal when the glide head makes contact with the disk, such as a magnetic recording disk. Calibration of the detection system utilizes a specially made bump disk that has asperities of desired height and size that protrude out of a flat disk surface. The glide head is flown over the bump disk, and by gradually reducing the disk spinning velocity, the head is brought closer to the disk and eventually into contact with the asperity. The onset of contact, as detected by the piezoelectric sensor, defines a disk spinning velocity for the head to fly at the desired height. In order to decouple the glide head flying characteristics and the piezoelectric quality and transfer function from other factors that affect the calibration of the detection system, laser pulses are directed at the glide head. Head vibrations are introduced in the glide head and detected by the piezoelectric sensor. The head excitations are recorded as a spectrogram in which the resonance frequencies are observed. From the amplitude and frequency readings, head resonance frequencies are identified and the piezoelectric sensor response is characterized. This allows the pre-screening of the head/sensor system and the decoupling of the glide head flying characteristics and the piezoelectric sensor quality from the asperity integrity effects on the calibration of the detection system.

    摘要翻译: 用于校准滑行头和检测器系统的方法和装置进行预筛选以确保检测系统中的滑动头和压电传感器的质量。 滑动头和压电传感器在滑动头与磁盘(例如磁记录盘)接触时检测信号。 检测系统的校准使用特别制造的凸起盘,其具有从平坦盘表面突出的期望的高度和尺寸的粗糙度。 滑动头在凸块上方飞行,通过逐渐减小磁盘旋转速度,磁头更接近磁盘并最终与凹凸接触。 由压电传感器检测到的接触开始限定了磁头旋转速度以使头部以期望的高度飞行。 为了从其他影响检测系统校准的因素中去除滑行头的飞行特性和压电质量和传递函数,激光脉冲指向滑行头。 头部振动被引入到滑动头中并由压电传感器检测。 磁头激励被记录为其中观察到共振频率的频谱图。 从振幅和频率读数,识别头部谐振频率,并表征压电传感器响应。 这允许头部/传感器系统的预筛选和滑翔头飞行特性和压电传感器质量的去耦从对检测系统的校准的粗糙度完整性影响。