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公开(公告)号：US20240094092A1
公开(公告)日：2024-03-21
申请号：US18175810
申请日：2023-02-28
发明人： Wataru WATANABE , Keisuke KAWAUCHI , Takayuki ITOH , Jumpei ANDO , Toshiyuki ONO
IPC分类号： G01M99/00
CPC分类号： G01M99/00
摘要： According to one embodiment, a manufacturing data analysis device includes processing circuitry. The processing circuitry acquires, from manufacturing data related to a plurality of products, first manufacturing data under a first acquisition condition. The first manufacturing data includes manufacturing condition data related to a manufacturing condition for each of the products and quality data related to quality for each of the products. The processing circuitry determines a second acquisition condition different from the first acquisition condition based on the first manufacturing data. The processing circuitry acquires second manufacturing data including the manufacturing condition data and the quality data from the manufacturing data under the second acquisition condition. The processing circuitry calculates an analysis result of a relationship between the manufacturing condition data and the quality data by analyzing the second manufacturing data. The processing circuitry generates output data including the analysis result.
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公开(公告)号：US20240085899A1
公开(公告)日：2024-03-14
申请号：US18176292
申请日：2023-02-28
发明人： Jumpei ANDO , Wataru WATANABE , Takayuki ITOH , Keisuke KAWAUCHI , Toshiyuki ONO
IPC分类号： G05B23/02
CPC分类号： G05B23/0281 , G05B23/0262
摘要： According to one embodiment, a data analysis apparatus includes processing circuitry. The processing circuitry acquires first factor data indicative of first manufacturing conditions of a first product, and acquires second factor data indicative of second manufacturing conditions of a second product. The processing circuitry computes, based on the first factor data, a first index value relating to a degree by which each of the first manufacturing conditions contributes to an abnormality, and computes, based on the second factor data, a second index value relating to a degree by which each of the second manufacturing conditions contributes to an abnormality. The processing circuitry computes a similarity between the first index value and the second index value.
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13.发明申请公开(公告)号：US20190026584A1
公开(公告)日：2019-01-24
申请号：US15894271
申请日：2018-02-12
发明人： Ryusuke HIRAI , Yasunori TAGUCHI , Wataru WATANABE
摘要： According to one embodiment, an information processing apparatus includes an input receiver, a template selector, and a tracker. The input receiver receives an input operation of a user. The template selector specifies at least one template out of a plurality of templates that are related to a shape of an object based on the input operation received by the input receiver. The tracker tracks the object in an image including the object by using the at least one template specified by the template selector.
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公开(公告)号：US20160014385A1
公开(公告)日：2016-01-14
申请号：US14704247
申请日：2015-05-05
发明人： Yuma SANO , Wataru WATANABE , Masahiro BABA
IPC分类号： H04N9/31
CPC分类号： H04N9/3194 , G03B21/147 , H04N9/3185 , H04N9/3188
摘要： According to one embodiment, an image processor includes a setter and a corrector. The setter sets correction information to cause an entirety of an object image to be viewable when an image projected onto a projection surface is viewed from a viewpoint. The object image is projected from a projection position. The setting is performed based on information relating to a configuration of the projection surface where the object image is projected, information relating to the projection position, and information relating to a position of the viewpoint. The corrector corrects the object image based on the correction information.
摘要翻译： 根据一个实施例，图像处理器包括设定器和校正器。 当从视点观看投影到投影表面上的图像时，设定器设置校正信息以使整个对象图像可见。 物体图像从投影位置投影。 基于与投影对象图像的投影面的结构有关的信息，与投影位置有关的信息以及与视点的位置有关的信息进行设定。 校正器基于校正信息校正对象图像。
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公开(公告)号：US20150363917A1
公开(公告)日：2015-12-17
申请号：US14691772
申请日：2015-04-21
发明人： Hisashi KOBIKI , Wataru WATANABE , Yuma SANO , Masahiro BABA
CPC分类号： G09G3/002 , G06F3/0425 , G09G2320/0247 , G09G2354/00 , G09G2360/145 , H04N9/3179 , H04N9/3194
摘要： According to one embodiment, an image processor includes: a detector; a calculator; and a corrector. The detector calculates a state signal indicating whether or not an operation is being performed on a projection surface where an image is projected. The calculating is based on information relating to the projection surface. The calculator calculates a correction parameter based on the state signal and the information relating to the projection surface. The corrector generates a corrected image based on the correction parameter and an image to be processed.
摘要翻译： 根据一个实施例，图像处理器包括：检测器; 一个计算器; 和校正器。 检测器计算指示在投影图像的投影表面上是否正在执行操作的状态信号。 该计算基于与投影面有关的信息。 计算器根据状态信号和与投影面相关的信息计算校正参数。 校正器基于校正参数和要处理的图像生成校正图像。
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16.发明申请CONTROLLER, CONTROL METHOD, IMAGE PROJECTION SYSTEM, AND IMAGE PROCESSOR 审中-公开控制器，控制方法，图像投影系统和图像处理器公开(公告)号：US20150215568A1
公开(公告)日：2015-07-30
申请号：US14603999
申请日：2015-01-23
IPC分类号： H04N5/74
CPC分类号： H04N9/3185 , H04N5/58 , H04N9/3179 , H04N9/3194
摘要： According to one embodiment, a controller includes: an analyzer; a determiner; a projection image generator. The analyzer analyzes an environment of a projection surface on which an image is projected, based on a capture image obtained by capturing a region including at least part of the projection surface. The determiner determines a parameter for controlling illumination light illuminating the region based on information regarding the analyzed environment. The projection image generator generates a projection image projected on the region based on the information regarding the environment and acquired image data.
摘要翻译： 根据一个实施例，控制器包括：分析器; 决定者 投影图像生成器。 基于通过拍摄包括至少一部分投影面的区域而获得的拍摄图像，分析器分析投影图像的投影面的环境。 确定器基于关于分析环境的信息来确定用于控制照亮该区域的照明光的参数。 投影图像生成器基于关于环境的信息和获取的图像数据来生成投影在该区域上的投影图像。
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公开(公告)号：US20140099027A1
公开(公告)日：2014-04-10
申请号：US13963643
申请日：2013-08-09
发明人： Wataru WATANABE , Masahiro BABA , Ryosuke NONAKA
IPC分类号： G06T5/00
CPC分类号： G06T5/00 , G06T5/007 , G06T2207/10004 , G06T2207/10024 , G06T2207/30201 , H04N1/60 , H04N1/6027 , H04N9/77
摘要： According to one embodiment, an image processing apparatus includes a chroma calculation unit, a lightness calculation unit, a glossiness calculation unit, and a correction unit. The chroma calculation unit is configured to calculate a chroma of each pixel of an image to be processed. The lightness calculation unit is configured to calculate a lightness of each pixel of the image. The glossiness calculation unit is configured to estimate a glossiness of each pixel of the image, based on the chroma and the lightness. The correction unit is configured to correct each pixel of the image so that a correction amount of a pixel is larger when the glossiness of the pixel is higher.
摘要翻译： 根据一个实施例，图像处理装置包括色度计算单元，亮度计算单元，光泽度计算单元和校正单元。 色度计算单元被配置为计算要处理的图像的每个像素的色度。 亮度计算单元被配置为计算图像的每个像素的亮度。 光泽度计算单元被配置为基于色度和亮度来估计图像的每个像素的光泽度。 校正单元被配置为校正图像的每个像素，使得像素的光泽度较高时像素的校正量较大。
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18.发明公开公开(公告)号：US20240281824A1
公开(公告)日：2024-08-22
申请号：US18486196
申请日：2023-10-13
IPC分类号： G06Q30/016
CPC分类号： G06Q30/016
摘要： According to one embodiment, a troubleshooting support apparatus includes processing circuitry. The processing circuitry acquires multiple pieces of document data which describe content of a problem relating to multiple articles or services. The processing circuitry extracts, from the multiple pieces of document data, multiple first keywords relating to the multiple articles or services together with attribute information. The processing circuitry records the multiple first keywords in a memory for the respective pieces of attribute information. The processing circuitry determines, based on a rate of occurrence of each of multiple second keywords relating to predetermined attribute information among the first keywords recorded in the memory, a display manner of first data relating to each of the multiple second keywords.
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公开(公告)号：US20240094091A1
公开(公告)日：2024-03-21
申请号：US18172437
申请日：2023-02-22
发明人： Wataru WATANABE , Keisuke KAWAUCHI , Takayuki ITOH , Jumpei ANDO , Toshiyuki ONO
IPC分类号： G01M99/00
CPC分类号： G01M99/00
摘要： According to one embodiment, a manufacturing data analysis device includes processing circuitry. The processing circuitry acquires manufacturing data including a manufacturing condition data group and a quality data group. The processing circuitry calculates one or more degrees of influence exerted by first manufacturing condition data included in the manufacturing condition data group on respective pieces of quality data included in the quality data group by analyzing the manufacturing data. The processing circuitry, in a case where one or more degrees of influence satisfy a determination condition, generates output data related to at least one of the first manufacturing condition data, one or more pieces of quality data on which the first manufacturing condition data has exerted the degrees of influence satisfying the determination condition, or the degrees of influence satisfying the determination condition.
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公开(公告)号：US20230081798A1
公开(公告)日：2023-03-16
申请号：US17652575
申请日：2022-02-25
发明人： Takayuki ITOH , Wataru WATANABE , Jumpei ANDO , Keisuke KAWAUCHI , Toshiyuki ONO
摘要： According to one embodiment, a data analysis apparatus includes processing circuitry. The processing circuitry acquires a data element group composed of a plurality of data elements, calculates, in regard to a first data element in the data element group, an index value indicative of a conditional dispersion from another data element in the data element group, extracts, based on the index value, a parent element having a high association with the first data element from the data element group, and outputs an analysis result including first information relating to the first data element and the parent element.
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