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    Microcontroller with context switch
    11.
    发明授权
    Microcontroller with context switch 有权
    具有上下文切换的微控制器

    公开(公告)号：US09195497B2

    公开(公告)日：2015-11-24

    申请号：US13830377

    申请日：2013-03-14

    Applicant: Microchip Technology Incorporated

    Inventor： Zeke Lundstrum ,  Fanie Duvenhage ,  Sean Steedman ,  Kevin Lee Kilzer ,  Joseph Julicher

    IPC: G06F9/30 ,  G06F9/48 ,  G06F9/38

    CPC classification number: G06F9/4812 ,  G06F9/30101 ,  G06F9/3012 ,  G06F9/30123 ,  G06F9/30138

    Abstract: A microprocessor or microcontroller device may have a central processing unit (CPU), a data memory coupled with the CPU, wherein the data memory is divided into a plurality of memory banks, wherein a bank select register determines which memory bank is currently coupled with the CPU. Furthermore, a first and second set of special function registers are provided, wherein upon occurrence of a context switch either the first or the second set of special function register are selected as active context registers for the CPU and the respective other set of special function registers are selected as inactive context registers, wherein at least some of the registers of the active context registers are memory mapped to more than two memory banks of the data memory and wherein all registers of the inactive context registers are memory mapped to at least one memory location within the data memory.

    Abstract translation: 微处理器或微控制器设备可以具有中央处理单元（CPU），与CPU耦合的数据存储器，其中数据存储器被分成多个存储体，其中存储体选择寄存器确定当前与 中央处理器。 此外，提供第一和第二组特殊功能寄存器，其中在上下文切换发生时，第一组或第二组特殊功能寄存器被选择为用于CPU和相应的另一组特殊功能寄存器的活动上下文寄存器 被选择为非活动上下文寄存器，其中活动上下文寄存器的至少一些寄存器被存储器映射到数据存储器的多于两个存储体，并且其中非活动上下文寄存器的所有寄存器被存储器映射到至少一个存储器位置 在数据存储器内。

    Microcontroller ADC with a variable sample and hold capacitor
    13.
    发明授权
    Microcontroller ADC with a variable sample and hold capacitor 有权
    具有可变采样和保持电容的微控制器ADC

    公开(公告)号：US08847802B2

    公开(公告)日：2014-09-30

    申请号：US13644818

    申请日：2012-10-04

    Applicant: Microchip Technology Incorporated

    Inventor： Zeke Lundstrum ,  Keith Curtis ,  Burke Davison ,  Sean Steedman ,  Yann LeFaou

    IPC: H03M1/00

    CPC classification number: H03M1/1245

    Abstract: An ADC module includes an analog to digital converter coupled with an analog bus, wherein the an analog to digital converter comprises a main sample and hold capacitor; and a plurality of additional sample and hold capacitances which can be programmably coupled in parallel with said main sample and hold capacitance.

    Abstract translation: ADC模块包括与模拟总线耦合的模数转换器，其中模数转换器包括主采样和保持电容器; 以及可以与所述主采样和保持电容并行编程地耦合的多个附加采样和保持电容。

    Microcontroller ADC with a Variable Sample & Hold Capacitor
    14.
    发明申请
    Microcontroller ADC with a Variable Sample & Hold Capacitor 有权
    具有可变采样和保持电容的微控制器ADC

    公开(公告)号：US20130088377A1

    公开(公告)日：2013-04-11

    申请号：US13644818

    申请日：2012-10-04

    Applicant: Microchip Technology Incorporated

    Inventor： Zeke Lundstrum ,  Keith Curtis ,  Burke Davison ,  Sean Steedman ,  Yann LeFaou

    IPC: H03M1/12

    CPC classification number: H03M1/1245

    Abstract: An ADC module includes an analog to digital converter coupled with an analog bus, wherein the an analog to digital converter comprises a main sample and hold capacitor; and a plurality of additional sample and hold capacitances which can be programmably coupled in parallel with said main sample and hold capacitance.

    Abstract translation: ADC模块包括与模拟总线耦合的模数转换器，其中模数转换器包括主采样和保持电容器; 以及可以与所述主采样和保持电容并行编程地耦合的多个附加采样和保持电容。

    Microcontroller with Optimized ADC Controller
    15.
    发明申请
    Microcontroller with Optimized ADC Controller 有权
    具有优化ADC控制器的微控制器

    公开(公告)号：US20130088246A1

    公开(公告)日：2013-04-11

    申请号：US13633616

    申请日：2012-10-02

    Applicant: Microchip Technology Incorporated

    Inventor： Zeke Lundstrum ,  Keith Curtis ,  Burke Davison ,  Sean Steedman ,  Yann LeFaou

    IPC: H03M1/12 ,  G01R27/26

    CPC classification number: H03K17/9622 ,  H03K2217/960705 ,  H03K2217/960725 ,  H03K2217/960765

    Abstract: An analog-to-digital (ADC) controller is used in combination with a digital processor of a microcontroller to control the operation of capacitance measurements using the capacitive voltage division (CVD) method. The ADC controller handles the CVD measurement process instead of the digital processor having to run additional program steps for controlling charging and discharging of a capacitive touch sensor and sample and hold capacitor, then coupling these two capacitors together, and measuring the resulting voltage charge thereon in determining the capacitance thereof. The ADC controller may be programmable and its programmable parameters stored in registers.

    Abstract translation: 模拟数字（ADC）控制器与微控制器的数字处理器组合使用，以使用电容分压（CVD）方法控制电容测量的操作。 ADC控制器处理CVD测量过程，而不是数字处理器必须运行额外的程序步骤，用于控制电容式触摸传感器和采样和保持电容器的充电和放电，然后将这两个电容器耦合在一起，并测量其上产生的电压电荷 确定其电容。 ADC控制器可以是可编程的，其可编程参数存储在寄存器中。

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