公开(公告)号：US20130039140A1

公开(公告)日：2013-02-14

申请号：US13651931

申请日：2012-10-15

Applicant: Micron Technology, Inc.

Inventor： Frankie F. Roohparvar ,  Benjamin Louie

IPC: G11C29/00

CPC classification number: G11C29/16 ,  G11C16/04

Abstract: Methods and apparatus for executing internal operations of memory devices utilizing instructions stored in the memory array of the memory device are disclosed. Decode blocks adapted to interpret instructions and data stored in the memory device are also disclosed. Methods can be used to perform internal self-test operations of the memory device by executing test procedures stored in the memory array of the memory device performing a self-test operation.

Abstract translation: 公开了利用存储在存储器件的存储器阵列中的指令执行存储器件的内部操作的方法和装置。 还公开了适于解释存储在存储装置中的指令和数据的解码块。 通过执行存储在执行自检操作的存储器件的存储器阵列中的测试程序，可以使用方法来执行存储器件的内部自检操作。