公开(公告)号：US20220342386A1

公开(公告)日：2022-10-27

申请号：US17861374

申请日：2022-07-11

Applicant: Micron Technology, Inc.

Inventor： Fatma Arzum Simsek-Ege ,  Shruthi Kumara Vadivel ,  Deepti Verma ,  Anshika Sharma ,  Lavanya Sriram ,  Trupti D. Gawai

IPC: G05B19/4093 ,  G05B19/418

Abstract: Methods, devices, and systems related to process control in manufacturing are described. In an example, a method can include receiving data from a first process control device affixed to a first manufacturing tool of a first type, identifying one or more attributes of the data via a second processing resource of a second process control device affixed to a second manufacturing tool of a second type different from the first type, determining one or more settings for the second manufacturing tool via the second processing resource in response to identifying the one or more attributes of the data, and sending a command including the one or more settings to the second manufacturing tool from the second process control device.

公开(公告)号：US11385618B2

公开(公告)日：2022-07-12

申请号：US16997717

申请日：2020-08-19

Applicant: Micron Technology, Inc.

Inventor： Fatma Arzum Simsek-Ege ,  Shruthi Kumara Vadivel ,  Deepti Verma ,  Anshika Sharma ,  Lavanya Sriram ,  Trupti D. Gawai

IPC: G05B19/418 ,  G05B19/4093

Abstract: Methods, devices, and systems related to process control in manufacturing are described. In an example, a method can include receiving data from a first process control device affixed to a first manufacturing tool of a first type, identifying one or more attributes of the data via a second processing resource of a second process control device affixed to a second manufacturing tool of a second type different from the first type, determining one or more settings for the second manufacturing tool via the second processing resource in response to identifying the one or more attributes of the data, and sending a command including the one or more settings to the second manufacturing tool from the second process control device.

公开(公告)号：US20220076816A1

公开(公告)日：2022-03-10

申请号：US17012998

申请日：2020-09-04

Applicant: Micron Technology, Inc.

Inventor： Yi Hu ,  Brooke Spencer ,  Deepti Verma ,  Jennifer F. Huckaby

IPC: G16H40/63 ,  G06N20/00 ,  A61B5/0408

Abstract: Methods, devices, and systems related to a wearable monitor with memory are described. An example device may include an electrode integrated into a multi-chip package (MCP) memory device, the electrode to monitor health data of a wearer of the wearable monitor. The device can include a first processing resource coupled to the MCP memory device, the electrode, or both, to receive the monitored health data. The MCP memory device may store the received health data. The MCP memory device may also be coupled to a wireless communication device. The wireless communication device may transfer the stored health data to a computing device. The computing device may be communicatively coupled to the example device.

公开(公告)号：US20220057777A1

公开(公告)日：2022-02-24

申请号：US16997717

申请日：2020-08-19

Applicant: Micron Technology, Inc.

Inventor： Fatma Arzum Simsek-Ege ,  Shruthi Kumara Vadivel ,  Deepti Verma ,  Anshika Sharma ,  Lavanya Sriram ,  Trupti D. Gawai

IPC: G05B19/4093

Abstract: Methods, devices, and systems related to process control in manufacturing are described. In an example, a method can include receiving data from a first process control device affixed to a first manufacturing tool of a first type, identifying one or more attributes of the data via a second processing resource of a second process control device affixed to a second manufacturing tool of a second type different from the first type, determining one or more settings for the second manufacturing tool via the second processing resource in response to identifying the one or more attributes of the data, and sending a command including the one or more settings to the second manufacturing tool from the second process control device.