公开(公告)号：US20130211761A1

公开(公告)日：2013-08-15

申请号：US13762244

申请日：2013-02-07

Applicant: NXP B.V.

Inventor： Ewout Brandsma ,  Maarten Christiaan Pennings ,  Aly Aamer Syed ,  Timo van Roermund

IPC: G01D18/00 ,  G06F17/00

CPC classification number: G01D18/00 ,  G01D21/00 ,  G05B19/0423 ,  G06F17/00

Abstract: According to an aspect of the invention a method for calibrating a measurement device is conceived wherein: a calibration device is brought into close proximity of the measurement device such that a data communication link is established between the measurement device and the calibration device; wherein the following steps are performed while the calibration device and the measurement device are in close proximity of each other: the calibration device performs a measurement of at least one physical phenomenon; the measurement device performs a measurement of the same physical phenomenon; the result of the measurement by the measurement device is compared with the result of the measurement by the calibration device; and calibration parameters are computed based on a difference between the result of the measurement by the measurement device and the result of the measurement by the calibration device.

Abstract translation: 根据本发明的一个方面，构想了一种用于校准测量装置的方法，其中：使校准装置靠近测量装置，使得在测量装置和校准装置之间建立数据通信链路; 其中在校准装置和测量装置彼此靠近的同时执行以下步骤：校准装置执行至少一种物理现象的测量; 测量装置执行相同物理现象的测量; 将测量装置的测量结果与校准装置的测量结果进行比较; 并且基于测量装置的测量结果与校准装置的测量结果之间的差异来计算校准参数。