公开(公告)号：US06642779B2

公开(公告)日：2003-11-04

申请号：US10080535

申请日：2002-02-25

Applicant: Prakash Easwaran ,  Sandeep Oswal ,  Naom Chaplik

Inventor： Prakash Easwaran ,  Sandeep Oswal ,  Naom Chaplik

IPC: H03B520

CPC classification number: H03H7/25 ,  H03J1/00

Abstract: A T-network containing three impedances is provided between two terminating ends connected to a non-fixed voltage level. Two impedances are connected in series between the two terminating ends. A third impedance is connected between the junction of the first two impedances and a fixed voltage. Switches may be used to trim the third impedance, thus obtaining a desired voltage between the two terminating ends. A terminal of any switches used for trimming can be connected to the fixed voltage node, thereby ensuring that the impedance introduced by the switches does not change substantially during different operating situations.

Abstract translation: 在连接到非固定电压电平的两个终端之间提供包含三个阻抗的T网络。 两个阻抗串联在两个端接端之间。 第三阻抗连接在前两个阻抗的结点和固定电压之间。 可以使用开关来修整第三阻抗，从而在两个端接端之间获得期望的电压。 用于修整的任何开关的端子可以连接到固定电压节点，从而确保在不同的操作情况下由开关引入的阻抗基本上没有变化。

公开(公告)号：US5677634A

公开(公告)日：1997-10-14

申请号：US559547

申请日：1995-11-16

Applicant: Peter A. Cooke ,  David M. Ivancic ,  Naom Chaplik ,  Michael C. Steinmeyer ,  Chia-mu Chang ,  Vernon P. Cooke

Inventor： Peter A. Cooke ,  David M. Ivancic ,  Naom Chaplik ,  Michael C. Steinmeyer ,  Chia-mu Chang ,  Vernon P. Cooke

IPC: G01R31/00 ,  G01R31/01 ,  G01R31/12

CPC classification number: G01R31/028

Abstract: A plurality of electrical circuit components having capacitance, e.g. ceramic capacitors, are tested simultaneously in a corresponding plurality of test channels. They are stressed by a variable voltage source that can produce an electrical potential selected from a wide range from low potential to high potential. For example the range of selectable potentials can be 1000 volts with a resolution of 1 volt. The charge current by which a component accumulates a charge is controlled to a selected linear rate by a current controller. Voltage sensors and current sensors measure accumulated charges and leakage current, respectively. The current sensor can be selectively sensitized to a plurality of anticipated leakage current ranges. In addition, the selected potentials can each be applied to the components in a single step or can be applied over time in ramp fashion. A processor can be used for running at least a prescribed test process on components, the processor being operatively coupled to, for controlling and receiving inputs from, the above elements. For example the processor is preferably coupled to the variable voltage source, the current controller, the voltage sensor, the current sensor, and a component discharge circuit, operatively coupled meaning that the processor controls.

Abstract translation: 多个具有电容的电路元件，例如 陶瓷电容器在相应的多个测试通道中同时测试。 它们被可变电压源压紧，可变电压源可以产生从低电位到高电位的宽范围内选择的电位。 例如，可选电位的范围可以是1000伏，分辨率为1伏。 通过电流控制器将组件累积电荷的充电电流控制为选定的线性速率。 电压传感器和电流传感器分别测量累积电荷和漏电流。 电流传感器可以选择性地对多个预期泄漏电流范围敏感。 此外，所选择的电位可以分别以单个步骤施加到组件，或者可以以斜坡方式随时间施加。 处理器可以用于对部件运行至少一个规定的测试过程，该处理器可操作地耦合到上述元件的控制和接收输入。 例如，处理器优选地耦合到可变电压源，电流控制器，电压传感器，电流传感器和组件放电电路，其可操作地耦合，意味着处理器控制。