公开(公告)号：US20140365416A1

公开(公告)日：2014-12-11

申请号：US14165392

申请日：2014-01-27

Applicant: POSTECH ACADEMY-INDUSTRY FOUNDATION ,  SAMSUNG ELECTRONICS CO., LTD.

Inventor： Jun Seok KIM ,  Jae Yoon SIM ,  Hyun Surk RYU ,  Hwasuk CHO

IPC: G06N3/063 ,  G06N3/08

CPC classification number: G06N3/063 ,  G06N3/049 ,  G11C11/412

Abstract: A synapse array based on a static random access memory (SRAM), a pulse shaper circuit, and a neuromorphic system are provided. The synapse array includes a plurality of synapse circuits. At least one synapse circuit among the plurality of synapse circuits includes at least one bias transistor and at least two cut-off transistors, and the at least one synapse circuit is configured to charge a membrane node of a neuron circuit connected with the at least one synapse circuit using a sub-threshold leakage current that passed through the at least one bias transistor.

Abstract translation: 提供了基于静态随机存取存储器（SRAM），脉冲整形器电路和神经形态系统的突触阵列。 突触阵列包括多个突触电路。 所述多个突触电路中的至少一个突触电路包括至少一个偏置晶体管和至少两个截止晶体管，并且所述至少一个突触电路被配置为对与所述至少一个连接的神经元电路的膜节点进行充电 使用通过所述至少一个偏置晶体管的子阈值漏电流的突触电路。

公开(公告)号：US20140330761A1

公开(公告)日：2014-11-06

申请号：US14223284

申请日：2014-03-24

Applicant: POSTECH ACADEMY-INDUSTRY FOUNDATION ,  Samsung Electronics Co., Ltd.

Inventor： Jun Seok KIM ,  Jae Yoon SIM ,  Hyun Surk RYU

IPC: G06N3/08

CPC classification number: G06N3/063 ,  G06N3/049

Abstract: Disclosed are a method and an apparatus for detecting spike event or transmitting spike event information generated in a neuromorphic chip. The apparatus for detecting spike event generated in a neuromorphic chip may detect spike event information for a plurality of neurons included in the neuromorphic chip based on a neuron group.

Abstract translation: 公开了一种用于检测在神经元芯片中产生的尖峰事件或发送尖峰事件信息的方法和装置。 用于检测在神经元芯片中产生的尖峰事件的装置可以基于神经元组来检测包括在神经元芯片中的多个神经元的尖峰事件信息。