摘要:
A method for modulating multiple-instruments and multiple-sensors using an electronic device. The electronic device controls an instrument to measure the working parameters of an object, and controls a sensor to detect the working temperature of the object. By comparing the working parameters against a predefined range, and comparing the working temperature against a predefined temperature value, the electronic device determines whether the instrument and the sensor need to be modulated. If any of the working parameters is not within the predefined range or if the working temperature is greater than the predefined temperature value, the electronic device controls the instrument and the sensor to be modulated by using a modulation transfer function and a predetermined direction.
摘要:
A method controls motions of a mechanical arm using an electronic device. The mechanical arm includes an x-axis, a y-axis, and a z-axis. The method sets a step angle of a motor installed in line with the z-axis, and predefines angles of rotation as reference points regarding orientation of the rotating arm when rotated. The method further calculates a rotation angle of the rotating arm in a polar coordinate system, calculates coordinate motions of the x-axis and the y-axis if a free end of the rotating arm orientates to one of the reference points, and calculates an offset correction value of a pole origin position of the polar coordinate system. After correcting each of the coordinate motions and the pole origin position, the method controls the mechanical arm to move, and drives the rotating arm to reach another reference point according to a multiple of the step angle.
摘要:
A simulation system and method for generating equivalent circuits compatible with HSPICE reads data corresponding to N-port network system format in a storage device, and obtains S-parameter matrixes from the N-port network system. S-parameters in the S-parameter matrix that satisfy passivity are checked, and an interpolation algorithm to supplement S-parameters with passivity when some S-parameters not satisfy passivity is performed. Numbers of pole-residue, times for recursion and a tolerant system error of a rational function are generated for determining S-parameters. A rational function matrix composed of S-parameters is generated by performing a vector fitting algorithm, and an equivalent circuit is generated compatible with HSPICE format based on the generated rational function matrix.
摘要:
A system and method for testing objects using a mechanical arm sets one or more first positions. When a user selects one or more second positions of the mechanical arm, a distance between each of the second positions and each of the first positions is calculated. A nearest first position of each of the second positions is determined. Each of the second positions is stored in a test list corresponding to each of the nearest first positions. The mechanical arm is controlled to move to each of the nearest first positions, and tests objects located at the second positions stored in each test list corresponding to each of the nearest first positions.
摘要:
An exemplary probe apparatus includes a fixture, a first probe assembly, a motor, a lead screw, two guide members, a second probe, and a reduction gear unit. The first probe assembly is fixedly attached to the fixture and includes a first probe. The motor has a drive shaft attached to the fixture. The lead screw is coupled to the fixture. The two guide members are attached to the fixture and parallel to the lead screw. The second probe assembly is moveably attached to the lead screw and the at least one guide member, and includes a second probe. The reduction gear unit is coupled to the drive shaft and the lead screw to transmit power from the motor to the second probe assembly through the lead screw. The second probe assembly is configured for moving the second probe towards or away from the first probe along the two guide members.
摘要:
A testing apparatus is for testing products on an assembly line and includes a worktable, a positioning device, and a testing member. The worktable includes a number of wheels pivotably attached to a bottom thereof, and a number of retractable feet attached to the bottom thereof. The positioning device is attached to the worktable and includes a number of clamping members to position a product to be test. The testing member is attached to the worktable and operated by a control box to move a robot arm with a testing head to test the product.
摘要:
A system and method for calibrating oscillograph channels assigns the same value to a drawing parameter of each channel. Each channel receives a signal sent by a signal generator. The oscillograph calculates a voltage difference between a standard signal voltage of a standard channel defined by a user and a signal voltage of each of the other channels. A sequence relationship between each of the other channels and the standard channel is determined. The oscillograph adjusts a deskew value of each of the other channels until each voltage difference is in an allowable range according to the sequence relationship.
摘要:
Parameters of a radio frequency filter can be changed by changing structure of each component of the filter. Material of each component, diameters of each of magnetic cylinders, density of each of conductive coils, thickness of a dielectric layer, and thickness of an insulation tube can be changed. When any component needs to be replaced, each cover is rotated, with connection partitions move to two slots of a resisting portion, to detach the filter.
摘要:
A test probe includes a filtering unit and a contact unit. The filtering unit includes an inductive component, a capacitive component, and an insulation component insulates the inductive component from the capacitive component. The contact unit contacts a test point to get a test signal. The filtering unit filters noise from the test signal. The test probe can be assembled and disassembled easily, and parameters of the filtering unit can be changed by changing structure of each component.
摘要:
A system and method generates a test file of a print circuit board (PCB). The system and method loads trace information of the PCB into a storage system of a test computer, searches the storage system for the trace information matching keywords received and selects traces to test from the searched results. The system and method further acquires length and test points of each selected trace, and sets test parameters of each test item. In addition, the system and method generates a test file of the PCB according to the test parameters, the length, and the test points of each selected trace.