IMAGE-BASED DEFECTS IDENTIFICATION AND SEMI-SUPERVISED LOCALIZATION

    公开(公告)号:US20210319546A1

    公开(公告)日:2021-10-14

    申请号:US16938812

    申请日:2020-07-24

    Abstract: A system for manufacturing defect classification is presented. The system includes a first neural network receiving a first data as input and generating a first output, a second neural network receiving a second data as input and generating a second output, wherein first neural network and the second neural network are trained independently from each other, and a fusion neural network receiving the first output and the second output and generating a classification. The first data and the second data do not have to be aligned. Hence, the system and method of this disclosure allows various type of data that are collected during manufacturing to be used in defect classification.

    FUSION MODEL TRAINING USING DISTANCE METRICS

    公开(公告)号:US20210319270A1

    公开(公告)日:2021-10-14

    申请号:US16938857

    申请日:2020-07-24

    Abstract: A method and a system are presented for controlling a performance of a fusion model. The method includes obtaining a first set and a second set of candidate models for a first and second neural networks, respectively. Each of the first and second set of candidate models is pre-trained with a first source and a second source, respectively. For each possible pairing of one candidate model from the first neural network and one candidate model from the second neural network, a model distance Dm is determined. A subset of possible pairings of one first candidate model and one second candidate model is selected based on the model distance Dm between them. Using the subset of possible parings, the first neural network and the second neural network are combined to generate two branches for a fusion model neural network.

    SYSTEM AND METHOD FOR MULTI-STAGE DISPLAY CIRCUIT INPUT DESIGN

    公开(公告)号:US20240160824A1

    公开(公告)日:2024-05-16

    申请号:US18326951

    申请日:2023-05-31

    CPC classification number: G06F30/367 G06F30/31

    Abstract: A method of designing inputs of a circuit includes identifying, by a circuit input solver, input ports of the circuit, classifying, by the circuit input solver, each one of the input ports as a DC line port of a plurality of DC line ports or a switching control line port of a plurality of switching control line ports, identifying, by the circuit input solver, one of the DC line ports as a data line port, determining, by the circuit input solver, for an emission phase of the circuit, a plurality of first parameters corresponding to signals of the plurality of DC line ports, and determining, by the circuit input solver, for an initialization phase of the circuit, a plurality of second parameters corresponding to signals of the plurality of switching control line ports based on the plurality of first parameters.

    SYSTEMS AND METHODS FOR IDENTIFYING MANUFACTURING DEFECTS

    公开(公告)号:US20220318672A1

    公开(公告)日:2022-10-06

    申请号:US17306737

    申请日:2021-05-03

    Abstract: Systems and method for classifying manufacturing defects are disclosed. In one embodiment, a first data sample satisfying a first criterion is identified from a training dataset, and the first data sample is removed from the training dataset. A filtered training dataset including a second data sample is output. A first machine learning model is trained with the filtered training dataset. A second machine learning model is trained based on at least one of the first data sample or the second data sample. Product data associated with a manufactured product is received, and the second machine learning model is invoked for predicting confidence of the product data. In response to predicting the confidence of the product data, the first machine learning model is invoked for generating a classification based the product data.

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