公开(公告)号：US20150260791A1

公开(公告)日：2015-09-17

申请号：US14728580

申请日：2015-06-02

Applicant: Texas Instruments Incorporated

Inventor： Lee D. Whetsel ,  Baher S. Haroun ,  Brian J. Lasher ,  Anjali Vij

IPC: G01R31/3177

CPC classification number: G01R31/3177 ,  G01R31/31727 ,  G01R31/318555

Abstract: IEEE 1149.1 Test Access Ports (TAPs) may be utilized at both IC and intellectual property core design levels. TAPs serve as serial communication ports for accessing a variety of embedded circuitry within ICs and cores including; IEEE 1149.1 boundary scan circuitry, built in test circuitry, internal scan circuitry, IEEE 1149.4 mixed signal test circuitry, IEEE P5001 in-circuit emulation circuitry, and IEEE P1532 in-system programming circuitry. Selectable access to TAPs within ICs is desirable since in many instances being able to access only the desired TAP(s) leads to improvements in the way testing, emulation, and programming may be performed within an IC. A TAP linking module is described that allows TAPs embedded within an IC to be selectively accessed using 1149.1 instruction scan operations.

Abstract translation: IEEE 1149.1测试接入端口（TAP）可用于IC和知识产权核心设计级别。 TAP用作用于访问IC和核心内的各种嵌入式电路的串行通信端口，包括： IEEE 1149.1边界扫描电路，内置测试电路，内部扫描电路，IEEE 1149.4混合信号测试电路，IEEE P5001在线仿真电路和IEEE P1532系统编程电路。 可选择地访问IC内的TAP是理想的，因为在许多情况下，仅能够访问期望的TAP导致在IC内可以执行测试，仿真和编程的方式的改进。 描述了一种TAP链接模块，其允许使用1149.1指令扫描操作来选择性地访问嵌入在IC内的TAP。

公开(公告)号：US09075113B2

公开(公告)日：2015-07-07

申请号：US14230771

申请日：2014-03-31

Applicant: Texas Instruments Incorporated

Inventor： Lee D. Whetsel ,  Baher S. Haroun ,  Brian J. Lasher ,  Anjali Vij

IPC: G01R31/3177 ,  G01R31/3185

CPC classification number: G01R31/3177 ,  G01R31/31727 ,  G01R31/318555

Abstract: IEEE 1149.1 Test Access Ports (TAPs) may be utilized at both IC and intellectual property core design levels. TAPs serve as serial communication ports for accessing a variety of embedded circuitry within ICs and cores including; IEEE 1149.1 boundary scan circuitry, built in test circuitry, internal scan circuitry, IEEE 1149.4 mixed signal test circuitry, IEEE P5001 in-circuit emulation circuitry, and IEEE P1532 in-system programming circuitry. Selectable access to TAPs within ICs is desirable since in many instances being able to access only the desired TAP(s) leads to improvements in the way testing, emulation, and programming may be performed within an IC. A TAP linking module is described that allows TAPs embedded within an IC to be selectively accessed using 1149.1 instruction scan operations.

Abstract translation: IEEE 1149.1测试接入端口（TAP）可用于IC和知识产权核心设计级别。 TAP用作用于访问IC和核心内的各种嵌入式电路的串行通信端口，包括： IEEE 1149.1边界扫描电路，内置测试电路，内部扫描电路，IEEE 1149.4混合信号测试电路，IEEE P5001在线仿真电路和IEEE P1532系统编程电路。 可选择地访问IC内的TAP是理想的，因为在许多情况下，仅能够访问期望的TAP导致在IC内可以执行测试，仿真和编程的方式的改进。 描述了一种TAP链接模块，其允许使用1149.1指令扫描操作来选择性地访问嵌入在IC内的TAP。

公开(公告)号：US20130139017A1

公开(公告)日：2013-05-30

申请号：US13670078

申请日：2012-11-06

Applicant: Texas Instruments Incorporated

Inventor： Lee D. Whetsel ,  Baher S. Haroun ,  Brian J. Lasher ,  Anjali Vij

IPC: G01R31/3177

CPC classification number: G01R31/3177 ,  G01R31/31727 ,  G01R31/318555

Abstract: IEEE 1149.1 Test Access Ports (TAPs) may be utilized at both IC and intellectual property core design levels. TAPs serve as serial communication ports for accessing a variety of embedded circuitry within ICs and cores including; IEEE 1149.1 boundary scan circuitry, built in test circuitry, internal scan circuitry, IEEE 1149.4 mixed signal test circuitry, IEEE P5001 in-circuit emulation circuitry, and IEEE P1532 in-system programming circuitry. Selectable access to TAPs within ICs is desirable since in many instances being able to access only the desired TAP(s) leads to improvements in the way testing, emulation, and programming may be performed within an IC. A TAP linking module is described that allows TAPs embedded within an IC to be selectively accessed using 1149.1 instruction scan operations.