公开(公告)号：US07257334B1

公开(公告)日：2007-08-14

申请号：US09232119

申请日：1999-01-15

Applicant: Thilo Weitzel

Inventor： Thilo Weitzel

IPC: H04B10/04 ,  H04B10/06 ,  H04B10/12 ,  H04B10/145 ,  H04B10/148

CPC classification number: H04B10/676 ,  G01J3/453

Abstract: The present invention relates to a device for detecting or generating and modulating optical signals, and having an angular dispersive element arranged to change angles of the optical signals or carrier and/or reference rays brought to interference.

Abstract translation: 本发明涉及一种用于检测或产生和调制光信号的装置，并且具有角度色散元件，该角度色散元件被布置成改变光信号或载波和/或引起干扰的参考光的角度。

公开(公告)号：US20050117169A1

公开(公告)日：2005-06-02

申请号：US10502195

申请日：2003-01-21

Applicant: Thilo Weitzel

Inventor： Thilo Weitzel

IPC: G01B9/02

CPC classification number: G01B9/02081 ,  G01B9/02022 ,  G01B11/22 ,  G01B2290/30 ,  G01B2290/70

Abstract: The present invention relates to a spectrally dispersive interferometric optical apparatus comprising a light source, means for the generation of a phase shift, means for the measurement of the intensity of the interference signals, means for the selective measurement of the intensity of the interference signal and means for the determination of the phase angles and/or of a relative phase shift of the intensity of the interference signals. In accordance with the invention, the means for the generation of a phase shift between components of different polarisation directions in at least one of the branches of the interferometer include a diffraction grating. The means for the selective determination of the intensity of the interference signal in dependence on the polarisation moreover permit a determination of the respective intensity for the TE components and for the TM components of the interference signal with respect to the coordinate system of the diffraction grating.

Abstract translation: 本发明涉及一种光谱色散干涉光学装置，其包括光源，用于产生相移的装置，用于测量干扰信号的强度的装置，用于选择性地测量干扰信号的强度的装置，以及 用于确定干涉信号强度的相位角和/或相对相移的装置。 根据本发明，用于在干涉仪的至少一个分支中产生不同偏振方向的分量之间的相移的装置包括衍射光栅。 用于根据极化选择性地确定干扰信号的强度的装置还允许确定相对于衍射光栅的坐标系的TE分量和干扰信号的TM分量的相应强度。