公开(公告)号：US5659257A

公开(公告)日：1997-08-19

申请号：US270272

申请日：1994-07-05

申请人： Yunsheng Lu ,  Weiwei Mao

发明人： Yunsheng Lu ,  Weiwei Mao

IPC分类号： G01R31/28 ,  G01R31/3167 ,  G01R31/02

CPC分类号： G01R31/3167 ,  G01R31/2813

摘要： A structure for measuring and testing discrete components interconnected with one or more integrated circuits on a mixed-signal circuit board. Each integrated circuit includes a test cell comprising a plurality of switches connected with a single on-chip bus which is in turn connected with a single circuit board bus. The structure permits a constant current to be supplied to the components over the single bus and voltage measurements to be made to determine the component values with a lower overhead in pins and board area.

摘要翻译： 用于测量和测试与混合信号电路板上的一个或多个集成电路互连的分立组件的结构。 每个集成电路包括测试单元，该测试单元包括与单个片上总线连接的多个开关，该单片总线又与单个电路板总线连接。 该结构允许通过单总线向组件提供恒定电流，并进行电压测量，以在引脚和电路板面积中以较低的开销确定元件值。