公开(公告)号：US20130202089A1

公开(公告)日：2013-08-08

申请号：US13748036

申请日：2013-01-23

Applicant: American Science and Engineering, Inc.

Inventor： Jeffrey Schubert ,  Jeffrey M. Denker ,  Jason Toppan ,  Michael Chesna ,  Richard Mastronardi ,  Robyn Smith ,  Richard Schueller ,  Jeffrey Illig

IPC: G01N23/203

CPC classification number: G01N23/203 ,  G01N23/04 ,  G01N23/201 ,  G01V5/0008 ,  G01V5/0025

Abstract: An x-ray inspection system using backscatter of an x-ray beam emitted through a scan panel contiguous with, but of a material distinct from, an enclosure that contains an x-ray source by which the x-ray beam is generated. The scan panel is contoured in such a manner as to be visibly blended with a shape characterizing the enclosure. In some embodiments, the beam traverses multiple scan panels, where one or more of the scan panels may be selected for beam filtration properties. The scan panel may be disposed interior to a sliding door, and may be structured to serve as a scatter shield.

Abstract translation: X射线检查系统使用通过与包含产生x射线束的x射线源的外壳不同的扫描面板发射的X射线束的反向散射。 扫描面板的轮廓是这样的，以便与表征外壳的形状可见地混合。 在一些实施例中，光束横穿多个扫描面板，其中可以选择一个或多个扫描面板用于束过滤特性。 扫描面板可以设置在滑动门的内部，并且可以被构造成用作散射屏蔽。