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    POLYURETHANE-CONTAINING NON-FOAMED MOLDED BODY
    2.
    发明公开
    POLYURETHANE-CONTAINING NON-FOAMED MOLDED BODY 审中-公开

    公开(公告)号：US20240255403A1

    公开(公告)日：2024-08-01

    申请号：US18587732

    申请日：2024-02-26

    Applicant: CANON KABUSHIKI KAISHA

    Inventor： RYO OGAWA ,  TAKAYUKI HIRATANI ,  KANA SATO ,  MASAHIRO WATANABE ,  TETSUO HINO

    IPC: G01N3/42 ,  B08B1/16 ,  G01N23/201 ,  G03G21/00

    CPC classification number: G01N3/42 ,  B08B1/16 ,  G01N23/201 ,  G01N2203/0082 ,  G03G21/0017

    Abstract: The molded body is a non-foamed molded body including a polyurethane, wherein a Martens hardness measured at a point on the surface of the molded body positioned at a shortest distance from the center of gravity G is 1.0 N/mm2 or more, and three points of Martens hardness measured in a cross-section of the molded body satisfies a specific relational expression, wherein an index value Kω from a scattering profile obtained by allowing a characteristic X-ray from a Cu tube to incident on a surface region to be evaluated of the molded body satisfies a specific relational expression, and wherein the molded body has an erosion rate E of 0.6 μm/g or less, which is measured with spherical alumina particles having an average particle diameter (D50) of 3.0 μm in the surface region to be evaluated.

    X-RAY SCATTERING APPARATUS AND X-RAY SCATTERING METHOD
    3.
    发明公开
    X-RAY SCATTERING APPARATUS AND X-RAY SCATTERING METHOD 审中-公开

    公开(公告)号：US20240248050A1

    公开(公告)日：2024-07-25

    申请号：US18562508

    申请日：2022-05-24

    Applicant: XENOCS SAS

    Inventor： Peter HOGHOJ ,  Karsten JOENSEN ,  Pierre PANINE

    IPC: G01N23/201 ,  G01N23/20008

    CPC classification number: G01N23/201 ,  G01N23/20008 ,  G01N2223/33

    Abstract: An X-ray scattering apparatus has a sample vacuum chamber, a sample holder placed inside the sample vacuum chamber for aligning and/or orienting a sample to be analyzed by X-ray scattering, an X-ray beam delivery system having a 2D X-ray source and a 2D monochromator and being arranged upstream of the sample holder for generating and directing an X-ray beam along a beam path in a propagation direction towards the sample holder. An X-ray detector placed inside a diffraction chamber connected to the sample vacuum chamber where the X-ray detector is arranged downstream of the sample holder and is movable, in a motorized way, along the propagation direction so as to detect the X-ray beam and X-rays scattered at different scattering angles, where the X-ray beam delivery system is configured to focus the X-ray beam onto a focal spot on or near the X-ray detector when placed at its distal position.

    Particle beam experiment data analysis device
    4.
    发明授权
    Particle beam experiment data analysis device 有权

    公开(公告)号：US11994454B2

    公开(公告)日：2024-05-28

    申请号：US17605065

    申请日：2020-04-24

    Applicant: Hitachi, Ltd. ,  TOYOTA JIDOSHA KABUSHIKI KAISHA

    Inventor： Akinori Asahara ,  Hidekazu Morita ,  Takuya Kanazawa ,  Kanta Ono ,  Masao Yano ,  Tetsuya Shoji

    IPC: G01N15/0205 ,  G01N23/201

    CPC classification number: G01N15/0211 ,  G01N23/201

    Abstract: Automated analysis of particle beam measurement results is facilitated by a device that calculates a spatial parameter distribution representing spatial structure of a sample based on a scattering pattern corresponding to projection of the spatial structure of the sample to wavenumber space, the projection being obtained by detecting scattering of a particle beam which enters the sample and intersects with the sample. The device includes a section to provide estimates for signals on the scattering pattern in association with at which point on a spatial parameter distribution of the sample interactions occur during scattering; a section to aggregate estimation results of the interaction estimation section to calculate a spatial parameter distribution of a sample matching an aggregated result; and a section to perform alternately and repeatedly estimation in the interaction estimation section and calculation in the parameter distribution calculation section in order to improve estimation accuracy in spatial parameter distributions.

    Small-angle x-ray scatterometry
    5.
    发明公开
    Small-angle x-ray scatterometry 审中-公开

    公开(公告)号：US20240077435A1

    公开(公告)日：2024-03-07

    申请号：US18307823

    申请日：2023-04-27

    Applicant: Bruker Technologies Ltd.

    Inventor： Alex Dikopoltsev ,  Matthew Wormington ,  Yuri Vinshtein ,  Alexander Krokhmal

    IPC: G01N23/201 ,  G01N23/207 ,  G01N23/223 ,  G01T1/166

    CPC classification number: G01N23/201 ,  G01N23/207 ,  G01N23/223 ,  G01T1/166 ,  G01N2223/6116

    Abstract: A method for evaluating a sample that includes an array of structural elements. The method includes obtaining a first small angle x-ray scattering (SAXS) pattern for a first angular relationship between the sample and an x-ray beam that exhibits a first collimation value and has a given cross-sectional area on a first side of the sample. A second SAXS pattern is obtained for a second angular relationship between the sample and the x-ray beam, while the x-ray beam exhibits a second collimation value that differs from the first collimation value while maintaining the given cross-sectional area of the x-ray beam on the first side of the sample, wherein the second angular relationship differs from the first angular relationship.

    INSPECTION DEVICE AND INSPECTION METHOD
    8.
    发明公开
    INSPECTION DEVICE AND INSPECTION METHOD 审中-公开

    公开(公告)号：US20230324317A1

    公开(公告)日：2023-10-12

    申请号：US17939145

    申请日：2022-09-07

    Applicant: Kioxia Corporation

    Inventor： Takahiro IKEDA ,  Takashi ICHIKAWA ,  Takaki HASHIMOTO ,  Hiroyuki TANIZAKI

    IPC: G01B15/04 ,  G01N23/201

    CPC classification number: G01N23/201 ,  G01B15/04 ,  G01N2223/054 ,  G01N2223/611

    Abstract: According to one embodiment, there is provided an inspection device including a measurement unit and a controller. The measurement unit measures a physical quantity in accordance with a predetermined pattern for a sample with the predetermined pattern, and generates a first spectral pattern in accordance with a measurement result. The controller predicts a processed cross-sectional shape by applying a parameter to a shape function indicating an ion flux amount in accordance with an etching depth in a case where the predetermined pattern is processed in dry etching processing, determines a second spectral pattern in accordance with the processed cross-sectional shape that has been predicted, adjusts the parameter while comparing the first spectral pattern with the second spectral pattern, and reconstructs the processed cross-sectional shape of the sample in accordance with an adjustment result.

    Semiconductor Measurements With Robust In-Line Tool Matching
    9.
    发明公开
    Semiconductor Measurements With Robust In-Line Tool Matching 审中-公开

    公开(公告)号：US20230258585A1

    公开(公告)日：2023-08-17

    申请号：US17673594

    申请日：2022-02-16

    Applicant: KLA Corporation

    Inventor： Stilian Ivanov Pandev

    IPC: G01N23/201 ,  G06N3/08

    CPC classification number: G01N23/201 ,  G06N3/08 ,  H01L21/67288

    Abstract: Methods and systems for improved monitoring of tool drift and tool-to-tool matching across large fleets of measurement systems employed to measure semiconductor structures are presented herein. One or more Quality Control (QC) wafers are measured by each of a fleet of measurement systems. Values of system variables are extracted from the QC measurement data associated with each measurement system using a trained QC encoder. The extracted values of the system variables are employed to condition the corresponding measurement model employed by each measurement tool to characterize structures under measurement having unknown values of one or more parameters of interest. Accurate tool-to-tool matching across a fleet of conditioned measurement systems is achieved by extracting values of system variables from measurement data collected from the same set of QC wafers. Tool health is monitored based on changes in values of system variables extracted from measurements performed at different times.

    Small angle x-ray scattering methods for characterizing the iron core of iron carbohydrate colloid drug products
    10.
    发明授权
    Small angle x-ray scattering methods for characterizing the iron core of iron carbohydrate colloid drug products 有权

    公开(公告)号：US11726049B2

    公开(公告)日：2023-08-15

    申请号：US17921235

    申请日：2021-05-04

    Applicant: Amphastar Pharmaceuticals, inc.

    Inventor： Jack Yongfeng Zhang ,  Mary Zi-Ping Luo ,  Thang Kien Chiu ,  Anthony Marrs ,  Selina Su

    IPC: G01N23/201 ,  G01N15/02 ,  G01N23/207 ,  G01N33/15

    CPC classification number: G01N23/201 ,  G01N15/02 ,  G01N23/207 ,  G01N33/15 ,  G01N2223/054 ,  G01N2223/056 ,  G01N2223/60

    Abstract: The present disclosure introduces methods for characterizing iron core carbohydrate colloid drug products, such as iron sucrose drug products. Disclosed methods enable the characterization of the iron core size of the iron core nanoparticles in iron carbohydrates as they exist in the formulation in solution, such as e.g. iron sucrose drug products, and more particularly, the average particle diameter size and size distribution(s) of the iron core nanoparticles. The disclosed methods apply small-angle X-ray scattering (SAXS) in parallel beam transmission geometry, with a sample mounted inside a capillary and centered in the X-ray beam, to iron carbohydrates, such as iron sucrose, in solution without the need to modify the sample, such as to remove unbound carbohydrates, dilute, or dry the sample, to accurately characterize the average iron core particle diameter size of the iron core nanoparticles. An example application of the disclosed method is to perform SAXS measurements under identical instrument settings on two samples of the same type of iron core nanoparticle colloid drug product for the purpose of comparing their iron core structures. Such comparisons are typically performed during the iron core carbohydrate colloid drug development process, and can include comparisons of samples that have been manipulated.

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