公开(公告)号：US20210187956A1

公开(公告)日：2021-06-24

申请号：US16074322

申请日：2016-05-26

Applicant: Hewlett-Packard Development Company, L.P.

Inventor： Joan Albert Miravet Jimenez ,  Albert Crespi Serrano ,  Aleix Fort Filgueira

IPC: B41J2/175

Abstract: In an example, a pressure system includes a fluid movement device, a buffer reservoir coupled to the fluid movement device, and a first fluid interface coupled to the buffer reservoir. In that example, the first fluid interface is able to couple to a pressurizable chamber of a print fluid container (that can apply force on a print fluid bag of the print fluid container).

公开(公告)号：US20210001654A1

公开(公告)日：2021-01-07

申请号：US16977737

申请日：2018-04-30

Applicant: HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.

Inventor： Aleix Fort Filgueira ,  Josep Maria Cuner Utges ,  Leyre Hernandez Martinez

IPC: B41J29/393

Abstract: An example method is disclosed of adjusting a print head parameter, the method comprising ejecting a print agent drop from a print head, determining a velocity of the print agent drop, and adjusting the print head parameter based on the velocity of the print agent drop wherein the print head parameter is a number of drops of print agent in an area and/or a density of print agent applied by the print head.

公开(公告)号：US20200369048A1

公开(公告)日：2020-11-26

申请号：US16493007

申请日：2018-01-30

Applicant: HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.

Inventor： Antonio Gracia Verdugo ,  Aleix Fort Filgueira ,  Carles Flotats Villagrasa

IPC: B41J11/00 ,  B65H23/18

Abstract: It is disclosed a substrate compactness detection method for a printer wherein the printer comprises a roller to receive a substrate roll and a media advance mechanism to receive a substrate from the substrate roll, the method comprising: determining a substrate thickness; advancing the substrate for a length; measuring an angular displacement of the roller caused by the advancing of the substrate; determining the substrate roll radius by using the length and the angular displacement; and calculating a compactness parameter in view of the substrate roll radius and the substrate thickness.