Abstract:
A sensor system comprises a broadband light source, a birefringent sensor, a detection circuit, and a signal processing unit. The preferred detection circuit further includes a variable frequency oscillator, a modulator, and a photodetector. The modulator modulates the output of the birefringent sensor with a modulation signal from the variable frequency oscillator. The modulation produces an interference signal having a variable interference frequency. By determining the frequency of the modulation signal from the variable frequency oscillator that minimizes the interference frequency, the detection system is able to determine the difference in frequency between first and second spectral components of the output of birefringent sensor. The detector may be constructed using entirely solid state optics/electronics. The preferred fiber grating sensor comprises a birefringent optical fiber having a cladding and a core. The cladding has first and second side holes formed therein that extend substantially parallel to the core, and that are substantially coextensively located with respect to each other along the length of the optical fiber. The first and second side holes are preferable positioned such that, in transverse cross section of the optical fiber, a first radial line that extends from the core to the first side hole is substantially perpendicular to a second radial line that extends from the core to the second side hole.
Abstract:
A fiber optic sensor system comprises an optical fiber, a first reflector and a second reflector. The first reflector provides a fixed reference for measuring the optical path length between the second reflector and a reference reflector. The first and second reflectors respectively receive first and second portions of light emitted by the optical fiber and then reflect the light back to the optical fiber. The optical path length between the first and second reflectors varies in accordance with a sensed parameter. In operation, first and second interferograms are acquired that are produced by the interference of light reflected from the first and second reflectors with light reflected from a reference reflector. The first and second interferograms are then used to determine an optical path length between first and second reflectors. Finally, the optical path length between the first and second reflectors is used to determine the value of the sensed parameter.