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    Microcontroller ADC with a variable sample and hold capacitor
    22.
    发明授权
    Microcontroller ADC with a variable sample and hold capacitor 有权
    具有可变采样和保持电容的微控制器ADC

    公开(公告)号：US08847802B2

    公开(公告)日：2014-09-30

    申请号：US13644818

    申请日：2012-10-04

    Applicant: Microchip Technology Incorporated

    Inventor： Zeke Lundstrum ,  Keith Curtis ,  Burke Davison ,  Sean Steedman ,  Yann LeFaou

    IPC: H03M1/00

    CPC classification number: H03M1/1245

    Abstract: An ADC module includes an analog to digital converter coupled with an analog bus, wherein the an analog to digital converter comprises a main sample and hold capacitor; and a plurality of additional sample and hold capacitances which can be programmably coupled in parallel with said main sample and hold capacitance.

    Abstract translation: ADC模块包括与模拟总线耦合的模数转换器，其中模数转换器包括主采样和保持电容器; 以及可以与所述主采样和保持电容并行编程地耦合的多个附加采样和保持电容。

    Microcontroller ADC with a Variable Sample & Hold Capacitor
    23.
    发明申请
    Microcontroller ADC with a Variable Sample & Hold Capacitor 有权
    具有可变采样和保持电容的微控制器ADC

    公开(公告)号：US20130088377A1

    公开(公告)日：2013-04-11

    申请号：US13644818

    申请日：2012-10-04

    Applicant: Microchip Technology Incorporated

    Inventor： Zeke Lundstrum ,  Keith Curtis ,  Burke Davison ,  Sean Steedman ,  Yann LeFaou

    IPC: H03M1/12

    CPC classification number: H03M1/1245

    Abstract: An ADC module includes an analog to digital converter coupled with an analog bus, wherein the an analog to digital converter comprises a main sample and hold capacitor; and a plurality of additional sample and hold capacitances which can be programmably coupled in parallel with said main sample and hold capacitance.

    Abstract translation: ADC模块包括与模拟总线耦合的模数转换器，其中模数转换器包括主采样和保持电容器; 以及可以与所述主采样和保持电容并行编程地耦合的多个附加采样和保持电容。

    Microcontroller with Optimized ADC Controller
    24.
    发明申请
    Microcontroller with Optimized ADC Controller 有权
    具有优化ADC控制器的微控制器

    公开(公告)号：US20130088246A1

    公开(公告)日：2013-04-11

    申请号：US13633616

    申请日：2012-10-02

    Applicant: Microchip Technology Incorporated

    Inventor： Zeke Lundstrum ,  Keith Curtis ,  Burke Davison ,  Sean Steedman ,  Yann LeFaou

    IPC: H03M1/12 ,  G01R27/26

    CPC classification number: H03K17/9622 ,  H03K2217/960705 ,  H03K2217/960725 ,  H03K2217/960765

    Abstract: An analog-to-digital (ADC) controller is used in combination with a digital processor of a microcontroller to control the operation of capacitance measurements using the capacitive voltage division (CVD) method. The ADC controller handles the CVD measurement process instead of the digital processor having to run additional program steps for controlling charging and discharging of a capacitive touch sensor and sample and hold capacitor, then coupling these two capacitors together, and measuring the resulting voltage charge thereon in determining the capacitance thereof. The ADC controller may be programmable and its programmable parameters stored in registers.

    Abstract translation: 模拟数字（ADC）控制器与微控制器的数字处理器组合使用，以使用电容分压（CVD）方法控制电容测量的操作。 ADC控制器处理CVD测量过程，而不是数字处理器必须运行额外的程序步骤，用于控制电容式触摸传感器和采样和保持电容器的充电和放电，然后将这两个电容器耦合在一起，并测量其上产生的电压电荷 确定其电容。 ADC控制器可以是可编程的，其可编程参数存储在寄存器中。

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