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公开(公告)号:US20090038404A1
公开(公告)日:2009-02-12
申请号:US12164620
申请日:2008-06-30
申请人: Hongxing Tang , Mo Li , Michael L. Roukes
发明人: Hongxing Tang , Mo Li , Michael L. Roukes
IPC分类号: G01B7/16
CPC分类号: G01L1/18 , G01L1/20 , G01N33/54346 , G01N33/54373 , G01Q20/04 , G01Q60/38
摘要: Thin metallic films are used as the piezoresistive self-sensing element in microelectromechanical and nanoelectromechanical systems. The specific application to AFM probes is demonstrated.
摘要翻译: 薄金属膜用作微机电和纳米机电系统中的压阻自感元件。 演示了AFM探针的具体应用。