公开(公告)号：US20150348307A1

公开(公告)日：2015-12-03

申请号：US14722771

申请日：2015-05-27

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Jaedon LEE ,  Youngsam SHIN ,  Wonjong LEE ,  Seokjoong HWANG

IPC: G06T15/06

CPC classification number: G06T15/06

Abstract: Provided is an apparatus and method of traversing an acceleration structure (AS) in a ray tracing. The method includes determining whether each child node of a target node that is included in the AS intersects a ray, determining a type of a child node that intersects the ray; and performing an operation corresponding to a leaf node, in response to the child node being the leaf node, thereby reducing a time taken to traverse the AS.

Abstract translation: 提供了一种在光线跟踪中横穿加速结构（AS）的装置和方法。 该方法包括确定包括在AS中的目标节点的每个子节点是否与射线相交，确定与射线相交的子节点的类型; 并且响应于子节点是叶节点执行与叶节点相对应的操作，从而减少遍历AS所花费的时间。