公开(公告)号：US20130199297A1

公开(公告)日：2013-08-08

申请号：US13750297

申请日：2013-01-25

申请人： Christophe Imbert ,  Jinchi Zhang ,  Benoit Lepage

发明人： Christophe Imbert ,  Jinchi Zhang ,  Benoit Lepage

IPC分类号： G01N29/27

CPC分类号： G01N29/27 ,  G01N29/262 ,  G01N2291/2634 ,  G01N2291/2675

摘要： A phased array system and the inspection method which is configured to inspect the weld seam of an HSAW for all standard types of flaws located both near pipe's internal and external surfaces in one scan pass, diminishing the need of making mechanical adjustment for the probes during the one pass of scan. The configuration includes the usage of at least one linear PA probe for Lamination inspection right above HAZ zone, at least one pair of PA probes for longitudinal defects inspection and holes detection and at least two pairs of PA probes for transversal defect inspections.

摘要翻译： 相控阵系统和检查方法，其被配置为在一次扫描过程中检查位于管内部和外部表面附近的所有标准类型的缺陷的HSAW的焊缝，减少了在探测期间对探针进行机械调节的需要 一次扫描。 该配置包括至少一个线性PA探针用于HAZ区域上方的层压检查，至少一对用于纵向缺陷检查和空穴检测的PA探针和用于横向缺陷检查的至少两对PA探针。

公开(公告)号：US20120206132A1

公开(公告)日：2012-08-16

申请号：US13028519

申请日：2011-02-16

申请人： Benoit Lepage

发明人： Benoit Lepage

IPC分类号： G01R33/12

CPC分类号： G01N27/9033

摘要： A shielded eddy current coil probe is formed on a printed circuit board and comprises a first coil component forming a test coil and a second coil component forming an active shielding coil. The test coil and the active shielding coil are concentrically arranged and the number of coil windings in the active shielding coil and the field direction thereof are configured to limit the induced field or the sensed field in the test object to the footprint area of the test coil on the test object. Multiple sets of test coils with active shielding coils can be provided on the same or different layers of the printed circuit board to realize different driver, receiver and combined driver/receiver coil configurations.

摘要翻译： 屏蔽涡流线圈探针形成在印刷电路板上，并包括形成测试线圈的第一线圈部件和形成有源屏蔽线圈的第二线圈部件。 测试线圈和有源屏蔽线圈同心地布置，有源屏蔽线圈中的线圈绕组数和其场方向被配置为将测试对象中的感应场或感测场限制到测试线圈的覆盖区域 在测试对象上。 可以在印刷电路板的相同或不同的层上提供多组具有有源屏蔽线圈的测试线圈，以实现不同的驱动器，接收器和组合的驱动器/接收器线圈配置。

公开(公告)号：US20090091318A1

公开(公告)日：2009-04-09

申请号：US12206798

申请日：2008-09-09

申请人： Benoit Lepage ,  Pierre Langlois ,  Michael Drummy

发明人： Benoit Lepage ,  Pierre Langlois ,  Michael Drummy

IPC分类号： G01N27/90

CPC分类号： G01N27/9013

摘要： A phased scanning method and phased scan eddy current array probe suitable for in-situ eddy current inspection of a structure without mechanical scanning. Overlapping subsets of the sensor elements within the array probe are dynamically connected in series and sequentially scanned to simulate the mechanical motion of a conventional array probe along a test surface. An algorithm to effectively balance the scan data is provided which comprises obtaining a reference scan at the time of probe installation, storing the measurement data from this reference scan in a memory device located within the probe, subtracting this reference curve from the curve obtained by all subsequent measurement scans to produce an adjusted curve, and processing the resulting adjusted curve through a high pass filter. A technique for verifying sensor elements of an eddy current array probe after permanent or semi-permanent installation against a test structure is also provided.

摘要翻译： 相位扫描方法和定相扫描涡流阵列探头，适用于没有机械扫描的结构的原位涡流检测。 阵列探头内的传感器元件的重叠子集被动态地串联并顺序扫描，以模拟常规阵列探针沿测试表面的机械运动。 提供了一种有效平衡扫描数据的算法，其中包括在探头安装时获取参考扫描，将来自该参考扫描的测量数据存储在位于探头内的存储器件中，从由所有检测器获得的曲线中减去该参考曲线 随后的测量扫描以产生调整曲线，并通过高通滤波器处理所得到的调整曲线。 还提供了用于在针对测试结构进行永久或半永久性安装之后验证涡流阵列探针的传感器元件的技术。

公开(公告)号：US20180284069A1

公开(公告)日：2018-10-04

申请号：US15472449

申请日：2017-03-29

申请人： Cécile BRÜTT ,  Guillaume Painchaud-April ,  Chi-Hang Kwan ,  Benoit Lepage

发明人： Cécile BRÜTT ,  Guillaume Painchaud-April ,  Chi-Hang Kwan ,  Benoit Lepage

IPC分类号： G01N29/07 ,  G01N29/26

CPC分类号： G01N29/07 ,  G01N29/0645 ,  G01N29/262 ,  G01N29/30 ,  G01N2291/011 ,  G01N2291/0423 ,  G01N2291/102

摘要： Disclosed is an ultrasonic non-destructive testing and inspection system and method for determining acoustic velocities in a test object. Beams of acoustic energy from firing an element of an emitting probe propagate in a first wedge, and a beam incident at the critical angle generates a surface wave in the test object. The surface wave propagates to a second wedge and signals are received at receiving elements of a receiving probe array. When a set of appropriate delays is applied to the receiving elements, the acoustic time-of-flight is the same to all receiving elements. Determination of the appropriate delays and the times-of-flight for P-type surface waves and Rayleigh surface waves enables computation of the P- and S-wave acoustic velocities in the test object. The time-of-flight measurement also enables computation of the separation between the first and second wedges.

公开(公告)号：US20180113100A1

公开(公告)日：2018-04-26

申请号：US15333367

申请日：2016-10-25

申请人： Martin St-Laurent ,  Jason Habermehl ,  Pierre Langlois ,  Benoit Lepage

发明人： Martin St-Laurent ,  Jason Habermehl ,  Pierre Langlois ,  Benoit Lepage

IPC分类号： G01N29/44 ,  G01N29/04 ,  G01N29/26 ,  G01B17/06

CPC分类号： G01B17/06 ,  G01N29/11 ,  G01N29/262 ,  G01N29/4463 ,  G01N29/4472 ,  G01N2291/0289 ,  G01N2291/044 ,  G01N2291/267

摘要： Disclosed is an assisted analysis unit for facilitating phased array defect inspection. The analysis unit comprises an identification & merging module, and a sizing module. The modules are capable of displaying defect contours from multiple groups of indications, and of recommending defect merging candidates and defect sizing methods. However both modules also accept user input so that the final decisions rest with the operator.

公开(公告)号：US09523660B2

公开(公告)日：2016-12-20

申请号：US14674988

申请日：2015-03-31

申请人： Benoit Lepage ,  Guillaume Painchaud-April

发明人： Benoit Lepage ,  Guillaume Painchaud-April

IPC分类号： G01N29/30 ,  G01N29/07 ,  G01N29/28

CPC分类号： G01N29/30 ,  G01N29/07 ,  G01N29/226 ,  G01N29/28 ,  G01N2291/0425 ,  G01N2291/262 ,  G01N2291/2634

摘要： The method for calibrating an inspection instrument coupled with acoustic transducers disposed at circumferential positions distributed around a surface of an elongated object to inspect generally has the steps of: for each one of the circumferential positions, measuring a first and a second received signal using two acoustic transducers disposed at two axial positions along the object, the received signals resulting from the propagation of an acoustic guided wave signal along the object; identifying an acoustic mode according to the first received and the second received signals using a known period of time associated with the propagation of the acoustic guided wave signal between the two axial positions along the object; and determining a coupling coefficient associated with the acoustic mode, the coupling coefficient being indicative of the coupling of the acoustic transducers on the object; and calibrating the inspection instrument coupled to the object based on the coupling coefficients.

摘要翻译： 用于校准检查仪器的方法，其配置在分布在细长物体的表面周围的周围位置的声学换能器通常具有以下步骤：对于每个圆周位置，使用两个声学测量第一和第二接收信号 传感器设置在沿对象的两个轴向位置处，所述接收信号是沿着物体传播声导波信号而产生的; 使用与沿着物体的两个轴向位置之间的声导波信号的传播相关联的已知时间段来识别根据第一接收和第二接收信号的声学模式; 并且确定与所述声学模式相关联的耦合系数，所述耦合系数指示所述物体上的所述声换能器的耦合; 并且基于耦合系数校准耦合到对象的检查仪器。

公开(公告)号：US20150276679A1

公开(公告)日：2015-10-01

申请号：US14226105

申请日：2014-03-26

申请人： Benoit LePAGE

发明人： Benoit LePAGE

IPC分类号： G01N27/90

CPC分类号： G01N27/90 ,  G01N27/9033

摘要： An eddy current object testing system includes an EC probe and an acquisition channel which is configured to receive an EC signal from the EC probe and to generate a visual output, namely an impedance plane representation, of the output. A display is coupled to the acquisition channel to display the visual output. The at least one probe is provided with a test loop substantially surrounding it and has a series switch which can be selectively closed or opened to thereby cause the image plane to assume a state that is indicative of a fault, if any, in the EC probe.

摘要翻译： 涡流对象测试系统包括EC探针和采集通道，其被配置为从EC探头接收EC信号并产生输出的视觉输出即阻抗平面表示。 显示器耦合到采集通道以显示视觉输出。 至少一个探针设置有基本上围绕其的测试环路，并且具有可选择性地闭合或打开的串联开关，从而使图像平面呈现指示EC探针中的故障（如果有的话）的状态 。

公开(公告)号：US08700342B2

公开(公告)日：2014-04-15

申请号：US12620756

申请日：2009-11-18

申请人： Benoit Lepage ,  Jason Habermehl

发明人： Benoit Lepage ,  Jason Habermehl

IPC分类号： G01B5/28 ,  G01B17/02 ,  G01N19/04

CPC分类号： G01N29/11 ,  G01N29/075 ,  G01N29/4463 ,  G01N2291/0231 ,  G01N2291/0258 ,  G01N2291/102

摘要： A multi-frequency bond-testing system using acoustic probes in conjunction with NDT/NDI inspection instruments. Bond-testing of test objects is carried out at multiple discrete frequencies to produce a single, combined amplitude C-scan. Alternatively, or in combination, the system provides a single, combined phase C-scan to enable proper interpretation of the C-scans. Amplitude and/or phase readings on test objects are normalized at the selected frequencies relative to tests performed on a defect-free object at those frequencies. In this manner, the non-linear behavior of a bond-testing probe over a frequency range chosen for a given inspection is compensated for. The invention enables providing more easily interpretable and sharper images which enable a more reliable and faster reading and identification of defects in the test objects.

摘要翻译： 使用声探头与NDT / NDI检测仪器结合使用的多频键合测试系统。 测试对象的绑定测试在多个离散频率下进行，以产生单个组合振幅C扫描。 或者或组合地，系统提供单个组合相位C扫描，以便正确解释C扫描。 相对于在这些频率上对无缺陷物体执行的测试，测试对象上的幅度和/或相位读数以选定的频率进行归一化。 以这种方式，对给定检查选择的频率范围内的键测试探针的非线性行为进行了补偿。 本发明能够提供更容易解释和更清晰的图像，其使得能够更可靠和更快速地读取和识别测试对象中的缺陷。

公开(公告)号：US08264221B2

公开(公告)日：2012-09-11

申请号：US12533417

申请日：2009-07-31

申请人： Denis Faucher ,  Benoit Lepage

发明人： Denis Faucher ,  Benoit Lepage

IPC分类号： G01N27/82 ,  G01N27/72 ,  G01R11/02 ,  G01R33/00

CPC分类号： G01N27/9026

摘要： An eddy current probe assembly suitable for inspecting a test object with longitudinal shape, being passed through the assembly in the object's axial direction during an inspection session, the probe assembly comprising multiple probe modules being disposed in a radial plane and with the modules partially overlaying on each other forming an iris structure encircling an inspection zone, wherein a movement in unison of each of the probe modules closer to or further away from the center of the inspection zone makes the inspection zone enlarged or contracted. Spring tension is applied on each of the probe modules so that constant life-off in maintained between the probe modules and the test surface. Array of eddy current elements for each probe module and multiple layers of probe modules can be employed to achieve complete coverage of the test surface. The radial cross-sectional shapes of the test objects can be of round or polygonal.

摘要翻译： 一种适用于检查具有纵向形状的测试对象的涡流探针组件，在检查过程期间沿物体的轴向方向穿过组件，探针组件包括多个探针模块，其设置在径向平面中，并且模块部分地覆盖在 彼此形成围绕检查区域的虹膜结构，其中每个探针模块的移动更靠近或远离检查区域的中心，使得检查区域扩大或收缩。 在每个探针模块上施加弹簧张力，使得在探针模块和测试表面之间保持恒定的寿命。 可以使用每个探针模块和多层探针模块的涡流元件阵列来实现测试表面的完全覆盖。 测试对象的径向横截面形状可以是圆形或多边形。

公开(公告)号：US08018228B2

公开(公告)日：2011-09-13

申请号：US12483649

申请日：2009-06-12

申请人： Benoit Lepage ,  Denis Faucher

发明人： Benoit Lepage ,  Denis Faucher

IPC分类号： G01R33/12 ,  G01N27/82

CPC分类号： G01N27/902 ,  G01N27/904

摘要： Disclosed is a method and an NDT/NDI probe deploying a slit or a flexible joint of probe bending region, preferably between two rows of probe elements to allow free bending between rows of probe elements and along the direction of the rows of elements and to allow two adjacent rows of elements to bend individually along its own natural bending lines perpendicular to the direction of the rows of elements. Also disclosed is the use of protective flexible pads to cover the probe elements and other probe components.

摘要翻译： 公开了一种方法和NDT / NDI探针，其展开探针弯曲区域的狭缝或柔性接头，优选在两排探针元件之间，以允许探针元件的行之间沿着元件行的方向自由弯曲并允许 两个相邻排的元件沿其自身的垂直于元件行方向的自然弯曲线单独弯曲。 还公开了使用保护性柔性垫来覆盖探针元件和其它探针部件。