PROOF TESTING BRITTLE COMPONENTS OF ELECTRONIC DEVICES

    公开(公告)号:US20170089818A1

    公开(公告)日:2017-03-30

    申请号:US15280514

    申请日:2016-09-29

    Applicant: Apple Inc.

    CPC classification number: G01N3/20

    Abstract: Methods and a system for proof testing brittle components of electronic devices are disclosed. The method may include positioning the brittle component relative to a probe of a testing system, contacting the probe to a surface of the brittle component at a first location, and applying a first force at the first location using the probe to create a first localized tensile band below the surface of the brittle component. The method may also include contacting the probe to the surface of the brittle component at a second location, distinct from the first location, and applying a second force at the second location using the probe to create a second localized tensile band below the surface of the brittle component.

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