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公开(公告)号:US11067819B2
公开(公告)日:2021-07-20
申请号:US16420058
申请日:2019-05-22
Applicant: Samsung Display Co., Ltd.
Inventor: Hyun Jin Cho , Jae Joong Kwon , Ju Hwa Ha , Jeong Woo Park , Su Bin Jung
Abstract: A optical device includes: a display device configured to output a display image; a lens on one side of the display device; and a polarization control unit between the display device and the lens and configured to output the display image output from the display device as first polarized light or second polarized light, wherein the lens comprises: a first polarizing mirror configured to reflect a display image of the first polarized light and to transmit a display image of the second polarized light; and a second polarizing mirror configured to reflect a display image of the second polarized light and to transmit a display image of the first polarized light.
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公开(公告)号:US20200227508A1
公开(公告)日:2020-07-16
申请号:US16739714
申请日:2020-01-10
Applicant: Samsung Display Co., Ltd.
Inventor: Dong Wook Kim , Won Kyu Kwak , Jin Woo Park , Hyun-Chol Bang , Sun-Ja Kwon , Jeong Woo Park
IPC: H01L27/32
Abstract: An exemplary embodiment of the present invention provides a display device including a first display area having a plurality of first pixel regions and a second display area having both a plurality of second pixel regions and a plurality of light transmissive regions. The second display area includes a plurality of scan lines. The second pixel region includes a plurality of pixel electrodes and a voltage line disposed on a same layer as the pixel electrodes. The voltage line overlaps the scan line to be parallel therewith in the light transmissive region.
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公开(公告)号:US20180136095A1
公开(公告)日:2018-05-17
申请号:US15816943
申请日:2017-11-17
Applicant: Samsung Display Co., Ltd.
Inventor: Cheol Min Park , Jeong Woo Park , Seung Kim , Seung Ho Kim , Hoi Kwan Lee , Woo Jin Cho , Hee Kyun Shin , Hyun Joon Oh
IPC: G01N1/30 , G01N21/958
Abstract: A method of detecting defects of a glass substrate includes cutting a glass mother substrate into a plurality of glass substrates, penetrating ions into an incision surface of the glass substrate to visualize defects of the incision surface, and photographing the defects of the incision surface to determine a bending strength of the glass substrate based on a size of the defects.
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