公开(公告)号：US20070165978A1

公开(公告)日：2007-07-19

申请号：US11331905

申请日：2006-01-13

Applicant: Xin Chen ,  Alan Evans ,  Joohyun Koh ,  Ming-Jun Li ,  Daniel Nolan

Inventor： Xin Chen ,  Alan Evans ,  Joohyun Koh ,  Ming-Jun Li ,  Daniel Nolan

IPC: G02B6/00

CPC classification number: C03B37/07 ,  C03B37/0124 ,  C03B2203/14 ,  G01M11/3181 ,  Y02P40/57

Abstract: A method for measuring fundamental mode cutoff wavelength of single polarization fiber comprising: (i) launching pulsed light of at least one wavelength λi into one end of the single polarization fiber; (ii) measuring backscattered light intensity corresponding to said wavelength to obtain the backscattered light intensity as a function of fiber position, wherein the backscattered light propagates through the same end of the fiber; and (iii) determining at least one cutoff wavelength and the corresponding position within said fiber for the cutoff wavelength, based on a specified threshold light intensity level.

Abstract translation: 一种用于测量单极化光纤的基模截止波长的方法，包括：（i）将至少一个波长λλ的脉冲光发射到单极化光纤的一端; （ii）测量对应于所述波长的反向散射光强度以获得作为光纤位置的函数的背向散射光强度，其中所述反向散射光通过所述光纤的同一端传播; 以及（iii）基于指定的阈值光强度水平确定所述光纤中的至少一个截止波长和所述光纤中的对应位置作为所述截止波长。

公开(公告)号：US06821449B2

公开(公告)日：2004-11-23

申请号：US10319044

申请日：2002-12-12

Applicant: Julie E. Caplen ,  Jean-Philippe J. deSandro ,  Joohyun Koh

Inventor： Julie E. Caplen ,  Jean-Philippe J. deSandro ,  Joohyun Koh

IPC: C03B3710

CPC classification number: C03B37/01861 ,  C03B37/01466 ,  C03B2201/31 ,  C03C25/68 ,  Y02P40/57

Abstract: This invention relates to a method of preparing an optical fiber preform with the preform having a uniform refractive index profile for the deposited oxide material that ultimately forms the optical fiber core. One embodiment of the invention relates to a process for preparing an optical fiber preform comprising the steps of etching a substrate a first time to remove a portion of a deposited oxide material from the preform by using a gas comprising an etchant gas containing fluorine at a sufficient temperature and gas concentration to create a fluorine contamination layer in the remaining deposited oxide material; and etching the preform a second time using a gas comprising an etchant gas containing fluorine at a sufficient temperature and gas concentration to remove the fluorine contamination layer without any substantial further fluorine contamination of the remaining deposited oxide material. Further embodiments relate to similar processes.

Abstract translation: 本发明涉及一种制备光纤预型件的方法，其中预成型件对于最终形成光纤芯的沉积的氧化物材料具有均匀的折射率分布。 本发明的一个实施方案涉及一种制备光纤预制件的方法，其包括以下步骤：首先通过使用包含含氟的蚀刻剂气体的气体第一次蚀刻从预成型体中沉积的氧化物材料的一部分， 温度和气体浓度，以在剩余的沉积氧化物材料中产生氟污染层; 并且在足够的温度和气体浓度下使用包含含氟蚀刻剂气体的气体第二次蚀刻预成型件以除去氟污染层，而没有剩余的沉积氧化物材料的任何实质上的进一步的氟污染。 另外的实施例涉及类似的过程。