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公开(公告)号:US2493089A
公开(公告)日:1950-01-03
申请号:US78331347
申请日:1947-10-31
Applicant: RCA CORP
Inventor: SACHTLEBEN LAWRENCE T
IPC: G11B7/00
CPC classification number: G11B7/00
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42.Method and apparatus for measuring the index of refraction of thin layers of transparent material 失效
Title translation: 用于测量透明材料薄层折射率的方法和装置公开(公告)号:US2425399A
公开(公告)日:1947-08-12
申请号:US49113243
申请日:1943-06-17
Applicant: RCA CORP
Inventor: SACHTLEBEN LAWRENCE T
IPC: G01N21/43
CPC classification number: G01N21/43
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公开(公告)号:US2286836A
公开(公告)日:1942-06-16
申请号:US28731439
申请日:1939-07-29
Applicant: RCA CORP
Inventor: SACHTLEBEN LAWRENCE T
CPC classification number: G01N21/9018 , G01N2033/0081
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公开(公告)号:US2225714A
公开(公告)日:1940-12-24
申请号:US28195139
申请日:1939-06-29
Applicant: RCA CORP
Inventor: SACHTLEBEN LAWRENCE T
IPC: G11B7/00
CPC classification number: G11B7/00
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公开(公告)号:US2200100A
公开(公告)日:1940-05-07
申请号:US13938637
申请日:1937-04-28
Applicant: RCA CORP
Inventor: SACHTLEBEN LAWRENCE T
IPC: B08B9/46
CPC classification number: B08B9/46 , G01N21/9027
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公开(公告)号:US2158307A
公开(公告)日:1939-05-16
申请号:US10227136
申请日:1936-09-24
Applicant: RCA CORP
Inventor: SACHTLEBEN LAWRENCE T
IPC: G11B7/00
CPC classification number: G11B7/00
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公开(公告)号:US2031858A
公开(公告)日:1936-02-25
申请号:US75223534
申请日:1934-11-09
Applicant: RCA CORP
Inventor: SACHTLEBEN LAWRENCE T
IPC: G11B7/00
CPC classification number: G11B7/00
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