Abstract:
Systems and methods are provided for offset correction of images from a flat panel detector. In some embodiments, the apparatus and method develops one or more offset maps, acquired during system idle, for the imaging system at a plurality of exposure windows. In some embodiments, exposure parameters acquired for the imaging system before image acquisition are used to select an offset map to subtract from subsequent X-ray images. In some further embodiments, executable instructions are disclosed for directing a processor to compile one or more offset map and exposure parameters to subtract based on a selected offset map noise elements from X-ray images and thereby minimizing the time between image acquisition and display of processed images.
Abstract:
A technique for selectively processing data from a digital detector includes determining an image area produced by orientation of a radiation source assembly. The assembly may include a radiation source and a collimator, which may be separately orientable. The image area is computed based upon the orientation of the radiation source assembly that projects a radiation beam towards an imaging plane. Image data from a detector within the imaging plane is selectively processed to improve computational efficiency. The system may also determine whether the image area falls within the imaging surface of the detector and inform an operator or inhibit an exposure if such is not the case.
Abstract:
A detector imaging system having an apparatus and method for correcting defective pixels in a current acquired image is disclosed herein. The system performs the correction of defective pixels using image feature information and temporal information. The system includes a correction scheme which includes determining a temporal matrix based on the current acquired image, at least one prior acquired image, and a filter weight; determining a local gradient based in part on the temporal matrix and a gradient kernel; and providing a correction value based on the local gradient to correct the defective pixel. The correction scheme is repeated a plurality of times as desired to correct all the defective pixels in the current acquired image.
Abstract:
In one aspect of the invention a method for processing a fluoroscopic image is provided. The method includes scanning an object with an imaging system including at least one radiation source and at least one detector array, acquiring a plurality of dark images to generate a baseline image, acquiring a plurality of lag images subsequent to the baseline image, determining a plurality of parameters of a power law using at least one lag image and at least one baseline image, and performing a log—log extrapolation of the power law including the determined parameters.
Abstract:
In an X-ray imaging system comprising an X-ray source, a digital X-ray detector and a display device, an arrangement is provided for setting or establishing the dynamic range of the image at the display device. The detector is operated to provide a set of count values representing X-ray image data acquired by the detector from an object of imaging, and a set of standardized values, such as optical density values, is derived from the count values. The optical density values collectively define a range of optical density values, and the dynamic range of the display device is mapped thereto. The display device is enabled to present an image of the object which appears similar to or substantially the same as an image of the object presented by, for example, a specified analog X-ray film.