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公开(公告)号:US06584897B2
公开(公告)日:2003-07-01
申请号:US10155654
申请日:2002-05-23
申请人: Chad Cobbley , Ford B. Grigg
发明人: Chad Cobbley , Ford B. Grigg
IPC分类号: B41N124
CPC分类号: B41F15/0818 , B41M1/12 , B41N1/24 , B41N1/248 , H01L24/11 , H01L24/81 , H01L2224/1132 , H01L2224/13099 , H01L2224/16 , H01L2224/81801 , H01L2924/00014 , H01L2924/01033 , H01L2924/01087 , H01L2924/014 , H01L2924/14 , H05K3/1225 , H05K3/321 , H05K3/3436 , H05K3/3484 , H05K2201/10719 , H01L2224/0401
摘要: A stencil for use in fabricating semiconductor devices is disclosed that has an aperture having a first portion extending from a first side thereof and a second portion extending from a second side thereof to minimize the shear stress between the material extruded therethrough and the stencil. The stencil allows for material to be extruded through the top of the stencil to the surface of the substrate and not contact the wall of the second portion of the aperture of the stencil. Since the material only contacts a small area of the first portion of the aperture near the top of the stencil, the material remains on the substrate and not in the aperture of the stencil.
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公开(公告)号:US06427587B1
公开(公告)日:2002-08-06
申请号:US09894935
申请日:2001-06-28
申请人: Chad Cobbley , Ford B. Grigg
发明人: Chad Cobbley , Ford B. Grigg
IPC分类号: B41N124
CPC分类号: B41F15/0818 , B41M1/12 , B41N1/24 , B41N1/248 , H01L24/11 , H01L24/81 , H01L2224/1132 , H01L2224/13099 , H01L2224/16 , H01L2224/81801 , H01L2924/00014 , H01L2924/01033 , H01L2924/01087 , H01L2924/014 , H01L2924/14 , H05K3/1225 , H05K3/321 , H05K3/3436 , H05K3/3484 , H05K2201/10719 , H01L2224/0401
摘要: A stencil for use in fabricating semiconductor devices is disclosed that has an aperture having a first portion extending from a first side thereof and a second portion extending from a second side thereof to minimize the shear stress between the material extruded therethrough and the stencil. The stencil allows for material to be extruded through the top of the stencil to the surface of the substrate and not contact the wall of the second portion of the aperture of the stencil. Since the material only contacts a small area of the first portion of the aperture near the top of the stencil, the material remains on the substrate and not in the aperture of the stencil.
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