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    Method for checking characteristics of electronic device and communication device included in electronic device
    62.
    发明授权
    Method for checking characteristics of electronic device and communication device included in electronic device 有权

    公开(公告)号：US11075703B2

    公开(公告)日：2021-07-27

    申请号：US16964854

    申请日：2019-01-24

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Jiyong Kim ,  Yeonjeong Kim ,  Jihoon Kim ,  Namkyoung Kim ,  Hyoseok Na ,  Junghwan Son ,  Tongho Chung

    IPC: H04W24/10 ,  H04B17/12 ,  H04L27/20 ,  H04B17/15

    Abstract: Various embodiments of the present invention relate to a method for inspecting whether an electronic device and a communication device included in the electronic device operate normally. A method for checking characteristics of a wireless communication device, according to various embodiments of the present invention, comprises the steps of: providing a wireless communication device at a first location, wherein the wireless communication device includes an antenna array and a wireless communication circuit electrically connected to the antenna array, and the wireless communication circuit is configured to transmit and receive signals having frequencies of 20 Ghz to 100 Ghz and includes a plurality of phase shifters configured to adjust phases of the signals in order to form directional beams together; providing a signal detecting device at a second location separated from the first location so as to detect a wireless signal from the wireless communication device; allowing the wireless communication device to transmit a first signal in a state in which all the phase shifters are configured to have a first delay; detecting a first power of the first signal by using the signal detecting device; allowing the wireless communication device to transmit a second signal in a state in which all the phase shifters are configured to have a second delay; and detecting a second power of the second signal by using the signal detecting device.

    Semiconductor devices
    64.
    发明授权
    Semiconductor devices 有权

    公开(公告)号：US10347641B2

    公开(公告)日：2019-07-09

    申请号：US15814824

    申请日：2017-11-16

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Jihoon Kim ,  Wonchul Lee

    IPC: H01L27/108 ,  H01L49/02

    Abstract: A semiconductor device includes a substrate including a cell region and peripheral region and bottom electrodes on the substrate. The bottom electrodes are arranged in a first row and a second row each extending in a first direction. The first row and the second row are adjacent to each other in a second direction perpendicular to the first direction. The bottom electrodes in the first row include an outermost bottom electrode and a next outermost bottom electrode that are separated by a first distance in the first direction. The bottom electrodes in the second row include an outermost bottom electrode and a next outermost bottom electrode that are separated by a second distance in the first direction. The outermost bottom electrode in the first row is on the peripheral region of the substrate. The outermost bottom electrode in the second row is on the cell region of the substrate.

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