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公开(公告)号：US3509335A
公开(公告)日：1970-04-28
申请号：US3509335D
申请日：1967-06-26
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公开(公告)号：US3671743A
公开(公告)日：1972-06-20
申请号：US3671743D
申请日：1969-04-03
CPC分类号： H01J37/266 , H01J37/29
摘要： Mirror electron microscope techniques are used indirectly to examine the electric or magnetic field in a specimen, such as a biological cell, situated outside the evacuated microscope chamber by examining the field on a layer or surface immediately inside a wall of the chamber adjacent the outside of which the specimen is placed.
摘要翻译： 间接地使用镜子电子显微镜技术来检查位于真空显微镜室外部的样品（例如生物细胞）中的电场或磁场，通过检查邻近室外的腔室内的层或表面上的场 标本被放置。
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