PHOTON DETECTOR AND PROCESS FOR DETECTING A SINGLE PHOTON
    3.
    发明申请
    PHOTON DETECTOR AND PROCESS FOR DETECTING A SINGLE PHOTON 有权
    光电探测器和检测单光子的过程

    公开(公告)号:US20150076361A1

    公开(公告)日:2015-03-19

    申请号:US14547189

    申请日:2014-11-19

    CPC classification number: H01L31/107

    Abstract: A photon detector article includes a photon detector configured to receive a primary waveform, the photon detector includes a multiplication region; a photon absorption region; a punch through voltage range; and a breakdown voltage; a source in electrical communication with the photon detector and configured to provide the primary waveform that includes a first voltage that is: less than a maximum value of the punch through voltage range, or effective to maintain a charge carrier in the absorption region; and a second voltage that is greater than the breakdown voltage; and a reference member in electrical communication with the source and configured to provide a reference waveform in response to receiving the primary waveform.

    Abstract translation: 光子检测器物品包括被配置为接收主波形的光子检测器,所述光子检测器包括乘法区域; 光子吸收区; 穿过电压范围; 和击穿电压; 与所述光子检测器电通信的源,并且被配置为提供包括第一电压的初级波形,所述第一电压是:小于所述穿通电压范围的最大值,或有效地在所述吸收区域中保持电荷载体; 以及大于所述击穿电压的第二电压; 以及与源电气通信并被配置为响应于接收主波形而提供参考波形的参考构件。

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