公开(公告)号：US09671440B2

公开(公告)日：2017-06-06

申请号：US14342153

申请日：2011-09-30

申请人： Yong Up Park ,  Won Suck Choi ,  Byung Sung Lee ,  Sun Kyu Choi ,  Kil Sin Kim ,  Seok Gon Kim ,  Sang-Jun Kim

发明人： Yong Up Park ,  Won Suck Choi ,  Byung Sung Lee ,  Sun Kyu Choi ,  Kil Sin Kim ,  Seok Gon Kim ,  Sang-Jun Kim

IPC分类号： G01R25/00 ,  G01R29/16

CPC分类号： G01R25/00 ,  G01R29/16

摘要： There are provided a method and device for detecting a zero phase component. The device for detecting a zero phase component includes a meter chip of a sequential sampling method, a data acquiring unit configured to acquire sequential data on a plurality of phases from the meter chip, and a zero phase current value calculating unit configured to calculate an instantaneous current value for fault detection by summing instantaneous current values for each phase from the acquired sequential data, and calculate a zero phase current value using the calculated instantaneous current value for fault detection.

公开(公告)号：US20140232373A1

公开(公告)日：2014-08-21

申请号：US14342153

申请日：2011-09-30

申请人： Yong Up Park ,  Won Suck Choi ,  Byung Sung Lee ,  Sun Kyu Choi ,  Kil Sin Kim ,  Seok Gon Kim ,  Sang-Jun Kim

发明人： Yong Up Park ,  Won Suck Choi ,  Byung Sung Lee ,  Sun Kyu Choi ,  Kil Sin Kim ,  Seok Gon Kim ,  Sang-Jun Kim

IPC分类号： G01R25/00

CPC分类号： G01R25/00 ,  G01R29/16

摘要： There are provided a method and device for detecting a zero phase component. The device for detecting a zero phase component includes a meter chip of a sequential sampling method, a data acquiring unit configured to acquire sequential data on a plurality of phases from the meter chip, and a zero phase current value calculating unit configured to calculate an instantaneous current value for fault detection by summing instantaneous current values for each phase from the acquired sequential data, and calculate a zero phase current value using the calculated instantaneous current value for fault detection.

摘要翻译： 提供了一种用于检测零相分量的方法和装置。 用于检测零相位分量的装置包括顺序采样方法的仪表芯片，数据获取单元，被配置为从仪表芯片获取关于多个相位的顺序数据;以及零相电流值计算单元，被配置为计算瞬时 通过从所获取的顺序数据求和每相的瞬时电流值求和故障检测的当前值，并使用所计算的用于故障检测的瞬时电流值来计算零相电流值。

公开(公告)号：US20130091908A1

公开(公告)日：2013-04-18

申请号：US13806170

申请日：2010-06-23

申请人： Byung-Sung Lee

发明人： Byung-Sung Lee

IPC分类号： E05B35/00

CPC分类号： E05B35/007 ,  E05B27/0028 ,  Y10T70/7486

摘要： A device for unlocking a lock recognizing a punched card includes a card recognition unit and an unlocking unit. The card recognition unit comprises: a base plate into which a card provided with a plurality of holes is inserted; a moving plate which is coupled to the base plate in such a manner that the moving plate can move closer to or away from the base plate; a first recognition unit that recognizes the holes in the card depending on insertions into the holes in the card in the process of the moving plate moving closer to the base plate; and a second recognition unit that recognizes the absence of a hole in the card based on contact with the area of the card lacking holes in the process of the moving plate moving closer to the base plate. The unlocking unit unlocks the lock based on the recognition results of the first and second recognition units.

摘要翻译： 用于解锁识别冲孔卡的锁的装置包括卡识别单元和解锁单元。 卡识别单元包括：插入设置有多个孔的卡的基板; 移动板，其以这样的方式联接到所述基板，使得所述移动板可以移动得更靠近或远离所述基板; 第一识别单元，其在移动板移动到靠近基板的过程中识别卡中的孔，这取决于在卡中的孔中的插入; 以及第二识别单元，其基于在移动板移动到靠近基板的过程中与卡缺少孔的区域的接触来识别卡中不存在孔。 解锁单元基于第一和第二识别单元的识别结果解锁锁定。