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1.发明授权Method and apparatus for obtaining the distance from an optical measurement instrument to an object under test 有权用于获得从光学测量仪器到被测物体的距离的方法和装置公开(公告)号：US07887184B2
公开(公告)日：2011-02-15
申请号：US11938145
申请日：2007-11-09
CPC分类号： G01B11/026 , A61B3/1005 , A61B3/1015 , G01M11/0221
摘要： Systems and methods for measuring a distance from a reference plane of an optical measurement instrument to a reference plane of an optical device under test are disclose. In one embodiment a system for measuring this distance includes an illumination system, an optical system, and optical sensor and a processor. The illumination system is configured or adapted to illuminate the object under test. The optical system is configured or adapted to receive light from the object under test and to produce an aberrated image. The optical sensor is configured or adapted to receive and sense the aberrated image. The processor determines the distance from the reference plane of the optical measurement instrument to the reference plane of the optical device based on an aspect of the aberrated image sensed by the optical sensor.
摘要翻译： 公开了用于测量从光学测量仪器的参考平面到被测光学器件的参考平面的距离的系统和方法。 在一个实施例中，用于测量该距离的系统包括照明系统，光学系统和光学传感器以及处理器。 照明系统被配置或适于照亮被测物体。 光学系统被配置或适于接收来自被测物体的光并产生像差图像。 光学传感器被配置或适于接收和感测像差图像。 基于由光学传感器感测到的像差图像的一个方面，处理器确定从光学测量仪器的参考平面到光学设备的参考平面的距离。
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2.发明申请公开(公告)号：US20080291396A1
公开(公告)日：2008-11-27
申请号：US11938145
申请日：2007-11-09
IPC分类号： A61B3/10
CPC分类号： G01B11/026 , A61B3/1005 , A61B3/1015 , G01M11/0221
摘要： Systems and methods for measuring a distance from a reference plane of an optical measurement instrument to a reference plane of an optical device under test are disclose. In one embodiment a system for measuring this distance includes an illumination system, an optical system, and optical sensor and a processor. The illumination system is configured or adapted to illuminate the object under test. The optical system is configured or adapted to receive light from the object under test and to produce an aberrated image. The optical sensor is configured or adapted to receive and sense the aberrated image. The processor determines the distance from the reference plane of the optical measurement instrument to the reference plane of the optical device based on an aspect of the aberrated image sensed by the optical sensor.
摘要翻译： 公开了用于测量从光学测量仪器的参考平面到被测光学器件的参考平面的距离的系统和方法。 在一个实施例中，用于测量该距离的系统包括照明系统，光学系统和光学传感器以及处理器。 照明系统被配置或适于照亮被测物体。 光学系统被配置或适于接收来自被测物体的光并产生像差图像。 光学传感器被配置或适于接收和感测像差图像。 基于由光学传感器感测到的像差图像的一个方面，处理器确定从光学测量仪器的参考平面到光学设备的参考平面的距离。
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