System and method for inspection of chips on tray
    1.
    发明授权
    System and method for inspection of chips on tray 有权
    托盘上芯片检查的系统和方法

    公开(公告)号:US07878336B2

    公开(公告)日:2011-02-01

    申请号:US12555245

    申请日:2009-09-08

    CPC classification number: G01N21/956

    Abstract: A system for inspection of chips on a tray comprises an unloading arm device, a first support platform, and a plurality of first tray-handling apparatuses. The first support platform is disposed adjacent to the unloading arm device, movable along a first direction. The plurality of first tray-handling apparatuses are arrayed along the first direction on the first support platform. Each of the plurality of first tray-handling apparatuses provides a particular size of tray for inspection, different from the size of tray provided by other first tray-handling apparatuses, wherein the first platform is configured to move a desired one of the plurality of first tray handling apparatuses before the unloading arm device.

    Abstract translation: 用于检查托盘上的碎屑的系统包括卸载臂装置,第一支撑平台和多个第一托盘处理装置。 第一支撑平台设置成与卸载臂装置相邻,可沿着第一方向移动。 多个第一托盘处理装置沿着第一方向排列在第一支撑平台上。 多个第一托盘处理装置中的每一个提供用于检查的特定尺寸的托盘,其不同于由其他第一托盘处理装置提供的托盘的尺寸,其中第一平台被配置成移动多个第一托盘处理装置中期望的一个 卸载臂装置前的托盘处理装置。

    SYSTEM AND METHOD FOR INSPECTION OF CHIPS ON TRAY
    2.
    发明申请
    SYSTEM AND METHOD FOR INSPECTION OF CHIPS ON TRAY 有权
    用于检查托盘的系统和方法

    公开(公告)号:US20100063619A1

    公开(公告)日:2010-03-11

    申请号:US12555245

    申请日:2009-09-08

    CPC classification number: G01N21/956

    Abstract: A system for inspection of chips on a tray comprises an unloading arm device, a first support platform, and a plurality of first tray-handling apparatuses. The first support platform is disposed adjacent to the unloading arm device, movable along a first direction. The plurality of first tray-handling apparatuses are arrayed along the first direction on the first support platform. Each of the plurality of first tray-handling apparatuses provides a particular size of tray for inspection, different from the size of tray provided by other first tray-handling apparatuses, wherein the first platform is configured to move a desired one of the plurality of first tray handling apparatuses before the unloading arm device.

    Abstract translation: 用于检查托盘上的碎屑的系统包括卸载臂装置,第一支撑平台和多个第一托盘处理装置。 第一支撑平台设置成与卸载臂装置相邻,可沿着第一方向移动。 多个第一托盘处理装置沿着第一方向排列在第一支撑平台上。 多个第一托盘处理装置中的每一个提供用于检查的特定尺寸的托盘,其不同于由其他第一托盘处理装置提供的托盘的尺寸,其中第一平台被配置成移动多个第一托盘处理装置中期望的一个 卸载臂装置前的托盘处理装置。

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