Method for designing alternating phase shift masks
    1.
    发明申请
    Method for designing alternating phase shift masks 失效
    设计交替相移掩模的方法

    公开(公告)号:US20060040188A1

    公开(公告)日:2006-02-23

    申请号:US10920786

    申请日:2004-08-18

    IPC分类号: G03C5/00 G06F17/50 G03F1/00

    CPC分类号: G03F1/30

    摘要: A method of designing an alternating phase shifting mask for projecting an image of an integrated circuit design having a plurality of spaced segments of critical dimension. The method initially identifies a phase universe boundary, such that the phase universe comprises a contiguous region of the integrated circuit layout wherein critical dimension segments within the phase universe are beyond a maximum phase interaction distance from any critical dimension segments outside the phase universe in accordance with predetermined design rules. The method then divides the phase universe into phase regions separated by the integrated circuit layout and any extensions of the critical dimension segments so that the phase regions are binary colorable within the phase universe.

    摘要翻译: 一种设计用于投影集成电路设计的图像的交替相移掩模的方法,所述集成电路设计具有关键维度的多个间隔的段。 该方法首先识别相位宇宙边界,使得相位宇宙包括集成电路布局的连续区域,其中相位宇宙内的关键尺寸段超过相位宇宙外的任何临界尺寸段的最大相位相互作用距离,根据 预定的设计规则。 该方法然后将相位宇宙划分为由集成电路布局和关键尺寸段的任何扩展分开的相位区域,使得相位区域在相位宇宙内是二进制可着色的。