Method for designing wiring topology for electromigration avoidance and fabrication method of integrate circuits including said method
    1.
    发明申请
    Method for designing wiring topology for electromigration avoidance and fabrication method of integrate circuits including said method 有权
    用于设计电迁移避免的布线拓扑的方法和包括所述方法的集成电路的制造方法

    公开(公告)号:US20120060137A1

    公开(公告)日:2012-03-08

    申请号:US12926505

    申请日:2010-11-23

    IPC分类号: G06F17/50

    CPC分类号: G06F17/5077 G06F2217/82

    摘要: A method for designing wiring topology for electromigration avoidance, which is composed of multiple sources, multiple sinks and multiple wires, is disclosed. The steps of said method to get an optimal topology includes: 1. calculating the length of all the wires to choose one of the wires with the shortest length as a feasible wire, 2. deciding a capacity of the feasible wire, 3. deciding the capacities of the other wire according to the capacity of the feasible wire, a flow of the source of the feasible wire and a flow of the sink of the feasible wire, 4. comparing the length of the other wires to select another feasible wire, 5. repeating said steps until finding all feasible wires for constructing a feasible topology, 6. creating a flow network according to the feasible topology, 7. iteratively checking if a negative cycle exists in the flow network and removing it until no more negative cycles.

    摘要翻译: 公开了一种用于设计电迁移避免的布线拓扑的方法,该方法由多个源,多个汇和多个线组成。 所述获得最佳拓扑的方法的步骤包括:1.计算所有电线的长度,选择最短长度的导线之一作为可行电线,2.确定可行电线的容量,3.确定 根据可行线的容量,可行线的流量和可行线的汇流量,另一条线的容量,4.比较其他线的长度以选择另一条可行的线,5 重复所述步骤,直到找到用于构建可行拓扑的所有可行的线路,6.根据可行拓扑创建流网络,7.迭代地检查流网络中是否存在负循环并将其移除直到没有更多的负循环。