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    Surveillance device detection utilizing non linear junction detection and reflectometry
    1.
    发明授权
    Surveillance device detection utilizing non linear junction detection and reflectometry 有权
    使用非线性结检测和反射测量的监控设备检测

    公开(公告)号：US07212008B1

    公开(公告)日：2007-05-01

    申请号：US11266538

    申请日：2005-11-03

    申请人： Bruce R. Barsumian ,  Thomas H. Jones ,  Charles A. Liter

    发明人： Bruce R. Barsumian ,  Thomas H. Jones ,  Charles A. Liter

    IPC分类号： G01R31/11

    CPC分类号： G01R31/11

    摘要： An apparatus for detecting concealed surveillance devices coupled to a transmission line uses either a time domain or frequency domain reflectometry operation to locate any impedance anomalies on the transmission line and a non-linear junction detection operation to classify the located impedance anomalies as semiconductor or non-semiconductor based anomalies. The reflectometry operation utilizes the reflection of a test signal to determine the distance to any reflecting impedance anomalies on the transmission line that may be indicative of an electronic device being coupled to the transmission line. The non-linear junction detection operation then compares the amplitudes of re-radiated second and third harmonics of a transmitted fundamental frequency signal to determine if the reflecting impedance anomalies are the result of a semiconductor based non-linear junction. A DC bias voltage and a balanced load may be added to the transmission line to enhance the line's response to the test signals. Any unidentified semiconductor based anomalies are manually inspected to determine if they represent convert surveillance devices.

    摘要翻译： 用于检测耦合到传输线的隐蔽监视装置的装置使用时域或频域反射测量操作来定位传输线上的任何阻抗异常和非线性结检测操作，以将所定位的阻抗异常分类为半导体或非线性结， 半导体的异常。 反射测量操作利用测试信号的反射来确定传输线上任何反射阻抗异常的距离，其可指示耦合到传输线的电子设备。 然后，非线性结检测操作将发射的基频信号的再次辐射的第二和第三谐波的振幅进行比较，以确定反射阻抗异常是否是基于半导体的非线性结的结果。 可以将直流偏置电压和平衡负载添加到传输线，以增强线路对测试信号的响应。 手工检查任何未识别的基于半导体的异常，以确定它们是否代表转换监视设备。