Resistors Formed Based on Metal-Oxide-Semiconductor Structures
    1.
    发明申请
    Resistors Formed Based on Metal-Oxide-Semiconductor Structures 有权
    基于金属氧化物半导体结构形成的电阻器

    公开(公告)号:US20130001704A1

    公开(公告)日:2013-01-03

    申请号:US13170751

    申请日:2011-06-28

    IPC分类号: H01L27/06

    CPC分类号: H01L28/20 H01L27/0629

    摘要: A device includes a metal-oxide-semiconductor (MOS) device, which includes a gate electrode and a source/drain region adjacent the gate electrode. A first and a second contact plug are formed directly over and electrically connected to two portions of a same MOS component, wherein the same MOS component is one of the gate electrode and the source/drain region. The same MOS component is configured to be used as a resistor that is connected between the first and the second contact plugs.

    摘要翻译: 一种器件包括金属氧化物半导体(MOS)器件,其包括栅电极和与栅电极相邻的源/漏区。 第一和第二接触插塞形成在相同的MOS部件的两部分上方并电连接,其中相同的MOS部件是栅极电极和源极/漏极区域之一。 相同的MOS部件被配置为用作连接在第一和第二接触插塞之间的电阻器。

    Resistors formed based on metal-oxide-semiconductor structures
    2.
    发明授权
    Resistors formed based on metal-oxide-semiconductor structures 有权
    基于金属氧化物半导体结构形成的电阻器

    公开(公告)号:US08648425B2

    公开(公告)日:2014-02-11

    申请号:US13170751

    申请日:2011-06-28

    IPC分类号: H01L27/06

    CPC分类号: H01L28/20 H01L27/0629

    摘要: A device includes a metal-oxide-semiconductor (MOS) device, which includes a gate electrode and a source/drain region adjacent the gate electrode. A first and a second contact plug are formed directly over and electrically connected to two portions of a same MOS component, wherein the same MOS component is one of the gate electrode and the source/drain region. The same MOS component is configured to be used as a resistor that is connected between the first and the second contact plugs.

    摘要翻译: 一种器件包括金属氧化物半导体(MOS)器件,其包括栅电极和与栅电极相邻的源/漏区。 第一和第二接触插塞形成在相同的MOS部件的两部分上方并电连接,其中相同的MOS部件是栅极电极和源极/漏极区域之一。 相同的MOS部件被配置为用作连接在第一和第二接触插塞之间的电阻器。