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1.
公开(公告)号:US20120054709A1
公开(公告)日:2012-03-01
申请号:US12871683
申请日:2010-08-30
申请人: Chen-Ming Tsai , Ke-Wei Su , Cheng Hsiao , Min-Chie Jeng , Jia-Lin Lo , Feng-Ling Hsiao , Yi-Shun Huang
发明人: Chen-Ming Tsai , Ke-Wei Su , Cheng Hsiao , Min-Chie Jeng , Jia-Lin Lo , Feng-Ling Hsiao , Yi-Shun Huang
IPC分类号: G06F17/50
CPC分类号: G06F17/5009
摘要: A method includes determining a mapping between model parameters and electrical parameters of integrated circuits. The model parameters are configured to be used by a simulation tool. A set of electrical parameters is provided, and the mapping is used to map the set of electrical parameters to a set of model parameters.
摘要翻译: 一种方法包括确定模型参数与集成电路的电气参数之间的映射。 模型参数被配置为由模拟工具使用。 提供一组电参数,并且映射用于将该组参数映射到一组模型参数。
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2.
公开(公告)号:US08370774B2
公开(公告)日:2013-02-05
申请号:US12871683
申请日:2010-08-30
申请人: Chen-Ming Tsai , Ke-Wei Su , Cheng Hsiao , Min-Chie Jeng , Jia-Lin Lo , Feng-Ling Hsiao , Yi-Shun Huang
发明人: Chen-Ming Tsai , Ke-Wei Su , Cheng Hsiao , Min-Chie Jeng , Jia-Lin Lo , Feng-Ling Hsiao , Yi-Shun Huang
CPC分类号: G06F17/5009
摘要: A method includes determining a mapping between model parameters and electrical parameters of integrated circuits. The model parameters are configured to be used by a simulation tool. A set of electrical parameters is provided, and the mapping is used to map the set of electrical parameters to a set of model parameters.
摘要翻译: 一种方法包括确定模型参数与集成电路的电气参数之间的映射。 模型参数被配置为由模拟工具使用。 提供一组电参数,并且映射用于将该组参数映射到一组模型参数。
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