摘要:
This is generally directed to systems and methods for providing shiftable column circuitry for a pixel array of an imaging system. Columns of a pixel array can be switchably coupled (e.g., through multiplexers) to their default column circuitry as well as coupled to one or more instances of a neighboring column's column circuitry. In response to an instance of default column circuitry being identified as defective, its corresponding column may “shift” and choose to couple to the neighboring column circuitry. Similarly, all following columns may also shift and couple to a neighboring column circuitry. In some embodiments, the defective column circuitry can be identified during wafer testing and identifying information (e.g., an address) of the defective column circuitry stored in memory. The identifying information may then be accessed from memory and, during an image signal readout phase, used to suitably shift the columns to avoid the defective column circuitry.
摘要:
The present invention provides providing a substrate, forming a sensor array on the substrate, forming a structured array of uncommitted logic surrounding the sensor array on the substrate, and providing electrical interconnects to the structured array of uncommitted logic, wherein the structured array of uncommitted logic forms functions that support the operation of the sensor array.
摘要:
This is generally directed to systems and methods for providing shiftable column circuitry for a pixel array of an imaging system. Columns of a pixel array can be switchably coupled (e.g., through multiplexers) to their default column circuitry as well as coupled to one or more instances of a neighboring column's column circuitry. In response to an instance of default column circuitry being identified as defective, its corresponding column may “shift” and choose to couple to the neighboring column circuitry. Similarly, all following columns may also shift and couple to a neighboring column circuitry. In some embodiments, the defective column circuitry can be identified during wafer testing and identifying information (e.g., an address) of the defective column circuitry stored in memory. The identifying information may then be accessed from memory and, during an image signal readout phase, used to suitably shift the columns to avoid the defective column circuitry.
摘要:
A motion detecting camera system includes a portable motion detection device having an image sensor for detecting motion within a field of view of the motion detection device and automatically generating a digital image of a scene within the field of view upon detection of motion. The motion detection device includes a cellular telephone transmitter for transmitting cellular telephone communications. The camera system includes a base unit having a display screen. The motion detection device is configured to automatically transmit the digital image via the transmitter to the base unit for display on the display screen.
摘要:
One or more dummy pixels of an image sensor device IC are modified to include programming circuitry that enables them to be used as non-volatile memory. Dummy pixels are non-imaging pixels that already exist in image sensor ICs and are addressable using the same circuitry that is used to address the imaging array of the IC. Therefore, there are no additional processing steps and no additional cost associated with implementing the dummy pixels or circuitry for addressing the dummy pixels in the IC. One or more of these non-imaging dummy pixels are modified to make the dummy pixels programmable to enable the pixels to store logic 1 bits and logic 0 bits.
摘要:
One or more dummy pixels of an image sensor device IC are modified to include programming circuitry that enables them to be used as non-volatile memory. Dummy pixels are non-imaging pixels that already exist in image sensor ICs and are addressable using the same circuitry that is used to address the imaging array of the IC. Therefore, there are no additional processing steps and no additional cost associated with implementing the dummy pixels or circuitry for addressing the dummy pixels in the IC. One or more of these non-imaging dummy pixels are modified to make the dummy pixels programmable to enable the pixels to store logic 1 bits and logic 0 bits.