公开(公告)号：US4640626A

公开(公告)日：1987-02-03

申请号：US757445

申请日：1985-07-22

申请人： Ralf Schmid ,  Johann Otto ,  Daniela Bernklau ,  Erwin Knapek

发明人： Ralf Schmid ,  Johann Otto ,  Daniela Bernklau ,  Erwin Knapek

IPC分类号： G01N25/72 ,  G01Q30/02 ,  G01Q30/10 ,  G01R31/308 ,  G01R31/00

CPC分类号： G01R31/308

摘要： A method and apparatus localize weak points within an electrical circuit. The electrical circuit is covered with a liquid crystal and is heated to a temperature just below the clearing point of the liquid crystal. The liquid crystal converts into its unordered condition given a temperature increase and leakage channel within the integrated circuit are completely localized. By irradiating a three-dimensional region, at least one current is induced in the region by generating electron-hole pairs within the electrical circuit, this at least one current causing a temperature increase at at least one weak point of the electrical circuit.

摘要翻译： 一种方法和装置将电路内的弱点定位。 电路用液晶覆盖，并被加热到刚好低于液晶的清除点的温度。 鉴于温度升高，液晶转换为无序状态，集成电路内的泄漏通道完全定位。 通过照射三维区域，通过在电路内产生电子 - 空穴对，在该区域中感应至少一个电流，该至少一个电流在电路的至少一个弱点处引起温度升高。