公开(公告)号：US4764010A

公开(公告)日：1988-08-16

申请号：US900415

申请日：1986-08-26

申请人： Volker Bachmann ,  Hubert Doker

发明人： Volker Bachmann ,  Hubert Doker

IPC分类号： G01B11/27 ,  G01B11/26

CPC分类号： G01B11/27 ,  Y10S33/21

摘要： On a testing or processing machine the axis of a second bracket is to be ctly aligned relative to the axis of a first bracket. For this purpose a laser is mounted on the first bracket which directs a beam onto the reflector surface of a disc mounted on the second bracket. The reflected beam produces a dot of light on the perforated disc, which is arranged about the exit aperture of the light source. By adjusting the second bracket the dot of light is directed onto the aperture. Once this is done the two brackets are in exact alignment. To align brackets arranged at an angle to each other a beam deflecting device can be arranged in the path of the beam. All the auxiliary devices needed for measurement can likewise be exactly adjusted in accordance with the method.

摘要翻译： 在测试或加工机器上，第二支架的轴线将相对于第一支架的轴线精确对准。 为此目的，激光器安装在第一支架上，其将光束引导到安装在第二支架上的盘的反射器表面上。 反射光束在穿孔光盘上产生一个点，该点围绕光源的出射孔设置。 通过调整第二个支架，光点指向光圈。 一旦这样做完成，两个方括号就完全一致。 为了对齐彼此成角度的支架，可以将梁偏转装置布置在梁的路径中。 同样可以根据该方法精确地调整测量所需的所有辅助装置。