公开(公告)号：US07962796B2

公开(公告)日：2011-06-14

申请号：US11941311

申请日：2007-11-16

申请人： Leon Hong ,  James T. Lee, Jr.

发明人： Leon Hong ,  James T. Lee, Jr.

IPC分类号： G06F11/00

CPC分类号： G06F11/3684

摘要： A test method for a data processing device includes determining both a current state of the device and a desired state of the device. A set of instructions to transition the data processing device from the current state to the target state is obtained by initially selecting a first source state from a set of possible source states and corresponding instructions that can transition the device to the desired state. The instruction associated with the first source state is placed on an instruction stack. The source state and instruction selection process is repeated until the selected source state corresponds to the current state of the device under test. The instructions in the stack are applied to the device under test, and the resulting device state compared to the specified state to determine a test result.

摘要翻译： 一种用于数据处理设备的测试方法包括确定设备的当前状态和设备的期望状态。 通过从可能的源状态的集合中初始选择第一源状态和可以将设备转换到期望状态的相应指令，获得将数据处理设备从当前状态转换到目标状态的一组指令。 与第一个源状态相关联的指令位于指令栈上。 源状态和指令选择过程被重复，直到所选择的源状态对应于被测器件的当前状态。 堆栈中的指令将应用于被测设备，并将结果设备状态与指定状态进行比较，以确定测试结果。

公开(公告)号：US20090132222A1

公开(公告)日：2009-05-21

申请号：US11941311

申请日：2007-11-16

申请人： Leon Hong ,  James T. Lee, JR.

发明人： Leon Hong ,  James T. Lee, JR.

IPC分类号： G06F9/44

CPC分类号： G06F11/3684

摘要： A test method for a data processing device includes determining both a current state of the device and a desired state of the device. A set of instructions to transition the data processing device from the current state to the target state is obtained by initially selecting a first source state from a set of possible source states and corresponding instructions that can transition the device to the desired state. The instruction associated with the first source state is placed on an instruction stack. The source state and instruction selection process is repeated until the selected source state corresponds to the current state of the device under test. The instructions in the stack are applied to the device under test, and the resulting device state compared to the specified state to determine a test result.

摘要翻译： 一种用于数据处理设备的测试方法包括确定设备的当前状态和设备的期望状态。 通过从可能的源状态的集合中初始选择第一源状态和可以将设备转换到期望状态的相应指令，获得将数据处理设备从当前状态转换到目标状态的一组指令。 与第一个源状态相关联的指令位于指令栈上。 源状态和指令选择过程被重复，直到所选择的源状态对应于被测器件的当前状态。 堆栈中的指令将应用于被测设备，并将结果设备状态与指定状态进行比较，以确定测试结果。